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Embedded tutorial I: design for manufacturability
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Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2005 Asia and South Pacific Design Automation Conference table of contents
Shanghai, China
SESSION: (Special session) DFM table of contents
Pages: 1 - 1  
Year of Publication: 2005
ISBN:0-7803-8737-6
Author
Vijay Pitchumani  Intel Corporation
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
: Shanghai IC Industry Association
: IEEE SSCS Shanghai Chapter
: IEEE CAS
: IEEE Beijing Section
: Fudan University
: Chinese Institute of Electronics
Publisher
ACM  New York, NY, USA
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ABSTRACT

DFM (Design for Manufacturability) has recently become a buzzword; it excites passion in semiconductor process, design, EDA and manufacturing circles. What is all this hype about?This tutorial reviews DFM, the ugly cousin of technology scaling, in a broad context, and includes both hard defects and parametric variations arising from manufacturing issues in its scope. It presents the various sources of the problem and their impact on yield, silicon vs. timing model correlation, mask cost, data size and time-to-market. It then presents design methodology and EDA tool solutions, both current and future, including restrictive design rules, preferred rules, layout fixes, design-manufacturing integration, lay-out-dependent modeling, variation-aware analysis and design.This tutorial is intended for engineers and project managers involved in design, EDA, OPC/RET/tapeout and design rule formulation.