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ABSTRACT
Process variations in digital circuits make sequential circuit timing validation an extremely challenging task. In this paper, a Statistical Bellman-Ford (SBF) algorithm is proposed to compute the longest path length distribution for directed graphs with cycles. Our SBF algorithm efficiently computes the statistical longest path length distribution if there exist no positive cycles or detects one if the circuit is likely to have a positive cycle. An important application of SBF is Statistical Retiming-based Timing Analysis (SRTA), where SBF is used to check for the feasibility of a given target clock period distribution for retiming. Our gate and wire delay distribution model considers several high-impact intra-die process parameters and accurately captures the spatial and reconvergent path correlations. The Monte Carlo simulation is used to validate the accuracy of our SBF algorithm. To the best of our knowledge, this is the first paper that propose the statistic version of the longest path algorithm for sequential circuits.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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1
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K. Bowman, S. Duvall, and J. Meindl, "Impact of die-to-die and within-die paraemter fluctuations on ..." in Proc. ISSCC, 2001.
|
| |
2
|
|
| |
3
|
|
 |
4
|
C. Visweswariah , K. Ravindran , K. Kalafala , S. G. Walker , S. Narayan, First-order incremental block-based statistical timing analysis, Proceedings of the 41st annual conference on Design automation, June 07-11, 2004, San Diego, CA, USA
[doi> 10.1145/996566.996663]
|
| |
5
|
|
| |
6
|
|
| |
7
|
Y. S. F-R. Boyer, El M. Aboulhamd, "An efficient verification method for a class of multi-phase sequential circuits," in ICECS, 2000.
|
| |
8
|
J. Cong and S. K. Lim, "Retiming-based timing analysis with an application to ..." IEEE TCAD, vol. 23, no. 12, 2004.
|
| |
9
|
R. Durrett, Probability: Theory and Examples. Duxbury Press, 1995.
|
| |
10
|
P. Billingsley, Probability and Measure. John Wiley & Sons, 1995.
|
| |
11
|
|
| |
12
|
|
| |
13
|
J. Rabaey, A. Chandrakasan, and B. Nikolic, Digital Integrated Circuits. Prentice Hall Electronics, 2003.
|
| |
14
|
SIA, "National Techonology Roadmap for Semiconductors," 2003.
|
| |
15
|
C. Clark, "The greatest of a finite set of random variables," in Operations Research, 1961.
|
| |
16
|
|
|