| A multi-technology-process reticle floorplanner and wafer dicing planner for multi-project wafers |
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Asia and South Pacific Design Automation Conference
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Proceedings of the 2006 Asia and South Pacific Design Automation Conference
table of contents
Yokohama, Japan
SESSION: Floorplanning
table of contents
Pages: 777 - 782
Year of Publication: 2006
ISBN:0-7803-9451-8
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IEEE Press
Piscataway, NJ, USA
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Downloads (6 Weeks): 3, Downloads (12 Months): 14, Citation Count: 2
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ABSTRACT
As the VLSI manufacturing technology advances into the deep sub-micron(DSM) era, the mask cost can reach one or two million dollars. Multiple project wafers (MPW) which put different dies onto the same set of masks is a good cost-sharing approach. Every design needs to be produced by its desired technology process, such as 1 poly with 4 metal layers (1P4M), or 1 poly with 5 metal layers (1P5M). Dies with different desired manufacturing processes cannot be produced from the same wafer, but they can be put onto the same set of masks in order to reduce the total cost of the used masks and wafers. In this paper, we propose a novel integer linear programming (ILP)-based floorplanner for shuttle runs consisting of projects requiring different desired processes. Two simulated annealing-based side-to-side wafer dicing planners are also presented. Experimental results show that our approach achieves 28% wafer reduction on average compared to a previous simulated annealing-based reticle floorplanner.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Warren Grobman , Robert Boone , Cece Philbin , Bob Jarvis, Reticle enhancement technology trends: resource and manufacturability implications for the implementation of physical designs, Proceedings of the 2001 international symposium on Physical design, p.45-51, April 01-04, 2001, Sonoma, California, United States
[doi> 10.1145/369691.369730]
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John, and B. Lin, "Mask Cost and Cycle Time Reduction" http://www.sematech.org/resources/litho/meetings/mask/20011001/E_TSMC.PDF
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C. Yang, "Challenges of Mask Cost & Cycle Time" http://www.sematech.org/resources/litho/meetings/mask/20011001/K_Mask_cost_Intel.pdf
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S. Chen and E. C. Lynn, "Efficient Placement of Chips on a Shuttle Mask", in Proc. of SPIE, Vol. 5130, 2003, pp.681--688.
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M. Andersson, C. Levcopoulos, and J. Gudmundsson, "Chips on Wafers" in Proc. Workshop on Algorithms and Data Structures, 2003.
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G. Xu, R. Tian, D. F. Wang, and A. Reich "Shuttle Mask Floorplanning" in Proc. of SPIE, Vol. 5256, 2003, pp.185--194.
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A. B. Kahng, I. Mandoiu, Q. Wang, X. Xu, and A. Zelikovsky, "Multi-Project Reticle Floorplanning and Wafer Dicing" in Proc. of ACM/IEEE on ISPD, 2004, pp. 70--77.
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G. Xu, R. Tian, D. Z. Pan, and D. F. Wang "A Multiple-objective Floorplanner for Shuttle Mask Optimization" in Proc. of SPIE, Vol. 5567, 2004, pp.185--144.
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M. Berkelaar, K. Eikland, P. Notebaert, lp_solve, available from http://groups.yahoo.com.tw/group/lp_solve
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