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ABSTRACT

This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A non-robust delay test is used while each test vector is compacted to detect multiple transition faults in a standard scan-based design targeting a stuck-at fault test. Our test technique applied to a microprocessor designed with 6M gate logic, 4MB level 2 cache, and 239K latches, achieves 90% coverage using 3,103 test vectors. We estimate the distribution of the delay of paths covered by our delay test. We also show the effectiveness of our method by discussing the correlation between the screening result and the actual number of delay defects.

REFERENCES

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.1 Types and Design Styles
          Subjects: Microprocessors and microcomputers

Additional Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.1 Types and Design Styles
          Subjects: VLSI (very large scale integration)
      B.7.2 Design Aids
          Subjects: Placement and routing
  B.8 Performance and Reliability
      B.8.2 Performance Analysis and Design Aids

General Terms:
Design, Performance

Keywords:
at-speed, delay defect, microprocessor, screening