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Constant impedance scaling paradigm for interconnect synthesis
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Source International Workshop on System-Level Interconnect Prediction archive
Proceedings of the 2006 international workshop on System-level interconnect prediction table of contents
Munich, Germany
SESSION: Physical interconnect analysis and optimization table of contents
Pages: 99 - 105  
Year of Publication: 2006
ISBN:1-59593-255-0
Authors
J. Balachandran  Microwave and RF Systems Group, Leuven, Belgium
S. Brebels  Microwave and RF Systems Group, Leuven, Belgium
G. Carchon  Microwave and RF Systems Group, Leuven, Belgium
M. Kuijk  Vrije Universiteit Brussel, Brussel, Belgium
W. De Raedt  Microwave and RF Systems Group, Leuven, Belgium
B. Nauwelaers  Katholieke Universiteit Leuven, Leuven, Belgium
E. Beyne  Microwave and RF Systems Group, Leuven, Belgium
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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ABSTRACT

On-chip global interconnects perceived as performance limiters for continued scaling of integrated circuits in nano-CMOS regimes highlight the importance of their proper design and optimization. A constant impedance scaling paradigm is proposed for systematic synthesis of complete interconnects physical parameters from system level performance metrics such as delay, power and wiring density. The methodology is illustrated for different system level targets and optimal physical parameters are deduced.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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Collaborative Colleagues:
J. Balachandran: colleagues
S. Brebels: colleagues
G. Carchon: colleagues
M. Kuijk: colleagues
W. De Raedt: colleagues
B. Nauwelaers: colleagues
E. Beyne: colleagues