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Statistical analysis and optimization in the presence of gate and interconnect delay variations
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Source International Workshop on System-Level Interconnect Prediction archive
Proceedings of the 2006 international workshop on System-level interconnect prediction table of contents
Munich, Germany
SESSION: Design for manufacturability table of contents
Pages: 37 - 37  
Year of Publication: 2006
ISBN:1-59593-255-0
Author
Chandu Visweswariah  IBM Thomas J. Watson Research Center, Yorktown Heights, NY
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 1,   Downloads (12 Months): 14,   Citation Count: 3
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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M. R. Guthaus, N. Venkateswaran, C. Visweswariah, and V. Zolotov. Gate sizing using incremental parameterized statistical timing analysis. IEEE International Conference on Computer-Aided Design, pages 1029--1036, November 2005. San Jose, CA.
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J. Xiong, V. Zolotov, C. Visweswariah, and N. Venkateswaran. Criticality computation in parameterized statistical timing. Proc. 2006 TAU (ACM/IEEE workshop on timing issues in the specification and synthesis of digital systems), February 2006. San Jose, CA, submitted for review.
 
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J. Xiong, V. Zolotov, C. Visweswariah, and N. Venkateswaran. Criticality computation in parameterized statistical timing. Proc. 2006 Design Automation Conference, July 2006. San Francisco, CA, submitted for review.
 
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Collaborative Colleagues:
Chandu Visweswariah: colleagues