| Statistical analysis and optimization in the presence of gate and interconnect delay variations |
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International Workshop on System-Level Interconnect Prediction
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Proceedings of the 2006 international workshop on System-level interconnect prediction
table of contents
Munich, Germany
SESSION: Design for manufacturability
table of contents
Pages: 37 - 37
Year of Publication: 2006
ISBN:1-59593-255-0
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Downloads (6 Weeks): 0, Downloads (12 Months): 16, Citation Count: 2
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REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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M. R. Guthaus, N. Venkateswaran, C. Visweswariah, and V. Zolotov. Gate sizing using incremental parameterized statistical timing analysis. IEEE International Conference on Computer-Aided Design, pages 1029--1036, November 2005. San Jose, CA.
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C. Visweswariah , K. Ravindran , K. Kalafala , S. G. Walker , S. Narayan, First-order incremental block-based statistical timing analysis, Proceedings of the 41st annual conference on Design automation, June 07-11, 2004, San Diego, CA, USA
[doi> 10.1145/996566.996663]
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J. Xiong, V. Zolotov, C. Visweswariah, and N. Venkateswaran. Criticality computation in parameterized statistical timing. Proc. 2006 TAU (ACM/IEEE workshop on timing issues in the specification and synthesis of digital systems), February 2006. San Jose, CA, submitted for review.
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J. Xiong, V. Zolotov, C. Visweswariah, and N. Venkateswaran. Criticality computation in parameterized statistical timing. Proc. 2006 Design Automation Conference, July 2006. San Francisco, CA, submitted for review.
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