| SOBER: statistical model-based bug localization |
| Full text |
Pdf
(214 KB)
|
| Source
|
ACM SIGSOFT Software Engineering Notes
archive
Volume 30 , Issue 5 (September 2005)
table of contents
SESSION: ESEC/FSE 2005
table of contents
Pages: 286 - 295
Year of Publication: 2005
ISSN:0163-5948
Also published in ...
|
|
Authors
|
|
Chao Liu
|
University of Illinois-UC, Urbana, IL
|
|
Xifeng Yan
|
University of Illinois-UC, Urbana, IL
|
|
Long Fei
|
Purdue University, West Lafayette, IN
|
|
Jiawei Han
|
University of Illinois-UC, Urbana, IL
|
|
Samuel P. Midkiff
|
Purdue University, West Lafayette, IN
|
|
| Publisher |
|
| Bibliometrics |
Downloads (6 Weeks): 19, Downloads (12 Months): 83, Citation Count: 26
|
|
|
ABSTRACT
Automated localization of software bugs is one of the essential issues in debugging aids. Previous studies indicated that the evaluation history of program predicates may disclose important clues about underlying bugs. In this paper, we propose a new statistical model-based approach, called SOBER, which localizes software bugs without any prior knowledge of program semantics. Unlike existing statistical debugging approaches that select predicates correlated with program failures, SOBER models evaluation patterns of predicates in both correct and incorrect runs respectively and regards a predicate as bug-relevant if its evaluation pattern in incorrect runs differs significantly from that in correct ones. SOBER features a principled quantification of the pattern difference that measures the bug-relevance of program predicates.We systematically evaluated our approach under the same setting as previous studies. The result demonstrated the power of our approach in bug localization: SOBER can help programmers locate 68 out of 130 bugs in the Siemens suite when programmers are expected to examine no more than 10% of the code, whereas the best previously reported is 52 out of 130. Moreover, with the assistance of SOBER, we found two bugs in bc 1.06 (an arbitrary precision calculator on UNIX/Linux), one of which has never been reported before.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
| |
1
|
|
| |
2
|
|
| |
3
|
G. Casella and R. Berger. Statistical Inference. Duxbury Press, second edition, 2001.
|
| |
4
|
|
 |
5
|
|
| |
6
|
William Dickinson , David Leon , Andy Podgurski, Finding failures by cluster analysis of execution profiles, Proceedings of the 23rd International Conference on Software Engineering, p.339-348, May 12-19, 2001, Toronto, Ontario, Canada
|
 |
7
|
Dawson Engler , David Yu Chen , Seth Hallem , Andy Chou , Benjamin Chelf, Bugs as deviant behavior: a general approach to inferring errors in systems code, Proceedings of the eighteenth ACM symposium on Operating systems principles, October 21-24, 2001, Banff, Alberta, Canada
|
| |
8
|
|
 |
9
|
|
| |
10
|
M. Harrold, G. Rothermel, K. Sayre, R. Wu, and L. Yi. A empirical investigation of the relationship between spectra differences and regression faults. Software Testing, Verification & Reliability, 10(3):171--194, 2000.
|
| |
11
|
Monica Hutchins , Herb Foster , Tarak Goradia , Thomas Ostrand, Experiments of the effectiveness of dataflow- and controlflow-based test adequacy criteria, Proceedings of the 16th international conference on Software engineering, p.191-200, May 16-21, 1994, Sorrento, Italy
|
 |
12
|
|
| |
13
|
E. Lehmann. Testing Statistical Hypotheses. Springer, second edition, 1997.
|
 |
14
|
Ben Liblit , Alex Aiken , Alice X. Zheng , Michael I. Jordan, Bug isolation via remote program sampling, Proceedings of the ACM SIGPLAN 2003 conference on Programming language design and implementation, June 09-11, 2003, San Diego, California, USA
|
 |
15
|
Ben Liblit , Mayur Naik , Alice X. Zheng , Alex Aiken , Michael I. Jordan, Scalable statistical bug isolation, Proceedings of the 2005 ACM SIGPLAN conference on Programming language design and implementation, June 12-15, 2005, Chicago, IL, USA
|
 |
16
|
|
 |
17
|
Madanlal Musuvathi , David Y. W. Park , Andy Chou , Dawson R. Engler , David L. Dill, CMC: a pragmatic approach to model checking real code, Proceedings of the 5th symposium on Operating systems design and implementation Due to copyright restrictions we are not able to make the PDFs for this conference available for downloading, December 09-11, 2002, Boston, Massachusetts
[doi> 10.1145/1060289.1060297]
|
| |
18
|
Andy Podgurski , David Leon , Patrick Francis , Wes Masri , Melinda Minch , Jiayang Sun , Bin Wang, Automated support for classifying software failure reports, Proceedings of the 25th International Conference on Software Engineering, May 03-10, 2003, Portland, Oregon
|
| |
19
|
B. Pytlik, M. Renieris, S. Krishnamurthi, and S. Reiss. Automated fault localization using potential invariants. I Proc. of the 5th Int. Workshop on Automated and Algorithmic DebuggingSymp (AADEBUG '03), pages 287--296, 2003.
|
| |
20
|
M. Renieris and S. Reiss. Fault localization with nearest eighbor queries. I Proc. of the 18th IEEE Int. Conf. on Automated Software Engineering (ASE '03), 2003.
|
 |
21
|
|
| |
22
|
|
| |
23
|
|
 |
24
|
|
| |
25
|
|
CITED BY 26
|
|
|
|
|
Maximilian Stoerzer , Barbara G. Ryder , Xiaoxia Ren , Frank Tip, Finding failure-inducing changes in java programs using change classification, Proceedings of the 14th ACM SIGSOFT international symposium on Foundations of software engineering, November 05-11, 2006, Portland, Oregon, USA
|
|
|
Alice X. Zheng , Michael I. Jordan , Ben Liblit , Mayur Naik , Alex Aiken, Statistical debugging: simultaneous identification of multiple bugs, Proceedings of the 23rd international conference on Machine learning, p.1105-1112, June 25-29, 2006, Pittsburgh, Pennsylvania
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
Mohammad Maifi Hasan Khan , Hieu Khac Le , Hossein Ahmadi , Tarek F. Abdelzaher , Jiawei Han, Dustminer: troubleshooting interactive complexity bugs in sensor networks, Proceedings of the 6th ACM conference on Embedded network sensor systems, November 05-07, 2008, Raleigh, NC, USA
|
|
|
Hong Cheng , David Lo , Yang Zhou , Xiaoyin Wang , Xifeng Yan, Identifying bug signatures using discriminative graph mining, Proceedings of the eighteenth international symposium on Software testing and analysis, July 19-23, 2009, Chicago, IL, USA
|
|
|
|
|
|
|
|
|
|
|