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Improving architecture testability with patterns
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Source Conference on Object Oriented Programming Systems Languages and Applications archive
Companion to the 20th annual ACM SIGPLAN conference on Object-oriented programming, systems, languages, and applications table of contents
San Diego, CA, USA
POSTER SESSION: Posters table of contents
Pages: 114 - 115  
Year of Publication: 2005
ISBN:1-59593-193-7
Authors
Roberta Coelho  PUC-Rio, Brazil
Uirá Kulesza  PUC-Rio, Brazil
Arndt von Staa  PUC-Rio, Brazil
Sponsors
ACM: Association for Computing Machinery
SIGPLAN: ACM Special Interest Group on Programming Languages
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 12,   Downloads (12 Months): 45,   Citation Count: 2
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ABSTRACT

There is a critical need for approaches to support software testing. Our research exploits the information described at Architectural Patterns to drive the definition of tests. As a result, we intend to assist developers in finding relatively shorter and cheaper paths to high dependable software.




Collaborative Colleagues:
Roberta Coelho: colleagues
Uirá Kulesza: colleagues
Arndt von Staa: colleagues