| Experimental evaluation of using dynamic slices for fault location |
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Proceedings of the sixth international symposium on Automated analysis-driven debugging
table of contents
Monterey, California, USA
Pages: 33 - 42
Year of Publication: 2005
ISBN:1-59593-050-7
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Downloads (6 Weeks): 3, Downloads (12 Months): 51, Citation Count: 19
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ABSTRACT
Dynamic slicing algorithms have been considered to aid in debugging for many years. However, as far as we know, no detailed studies on evaluating the benefits of using dynamic slicing for detecting faulty statements in programs have been carried out. We have developed a dynamic slicing framework that uses dynamic instrumentation to efficiently collect dynamic slices and reduced ordered Binary Decision Diagrams (roBDDs) to compactly store them. We have used the above framework to implement three variants of dynamic slicing algorithms including: data slicing, full slicing, and relevant slicing algorithms. We have carried out detailed experiments to evaluate these algorithms. Our results show that full slices and relevant slices can considerably reduce the subset of program statements that need to be examined to locate faulty statements. We expect that the observations presented here will enable development of new slicing based algorithms for automated debugging.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 19
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Neelam Gupta , Haifeng He , Xiangyu Zhang , Rajiv Gupta, Locating faulty code using failure-inducing chops, Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering, November 07-11, 2005, Long Beach, CA, USA
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Rui Abreu , Alberto González , Peter Zoeteweij , Arjan J. C. van Gemund, Automatic software fault localization using generic program invariants, Proceedings of the 2008 ACM symposium on Applied computing, March 16-20, 2008, Fortaleza, Ceara, Brazil
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Andreas Leitner , Manuel Oriol , Andreas Zeller , Ilinca Ciupa , Bertrand Meyer, Efficient unit test case minimization, Proceedings of the twenty-second IEEE/ACM international conference on Automated software engineering, November 05-09, 2007, Atlanta, Georgia, USA
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