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Generating optimal distinguishing sequences with a model checker
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Source ACM SIGSOFT Software Engineering Notes archive
Volume 30 ,  Issue 4  (July 2005) table of contents
SESSION: Advances in Model-Based Testing (A-MOST 2005) table of contents
Pages: 1 - 7  
Year of Publication: 2005
ISSN:0163-5948
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Authors
Christopher Robinson-Mallett  University of Potsdam, Germany
Peter Liggesmeyer  University of Kaiserslautern, Germany
Tilo Mücke  University of Brunswick, Germany
Ursula Goltz  University of Brunswick, Germany
Publisher
ACM  New York, NY, USA
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ABSTRACT

This paper presents an approach for the automatic generation of shortest Distinguishing Sequences (DS) with the Uppaal model checker. The presented method is applicable to a large number of extended finite state machines and it will find an optimal result, if a DS sequence exists for the considered automaton. Our approach is situated in an integrated testing environment that is used to generate checking sequences. The generation method is based on a DS model, which is derived from the same test model that is used for generating test cover sets. The problem of generating DS is reduced to the definition of a DS model and for this reason the complexity of our approach depends mainly on the used model checking algorithm. This means, that the presented method is automatically improved, when the model checking algorithm is improved. This includes the generation of optimal DS depending on the ability of the model checker to produce optimal results.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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M. Clarke, O. Grumberg, D. A. Peled. Model Checking. MIT Press. Boston, 2000.
 
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E. F. Moore. Gedanken-Experiments on Sequential Machines. Automata Studies (Annals of Mathematics Studies), (34), 1956.
 
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A. D. Friedman, P. R. Menon, Fault Detection in Digital Circuits, Prentice Hall, Englewood Cliffs, NJ, 1971
 
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Michaela Huhn Tilo Mücke. Generation of Optimized Testsuites for UML Statecharts with Time. In Robert M. Hierons Roland Groz, editor, Testing of Communicating Systems, Berlin, March 2004. Springer.
 
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F. C. Hennie, Fault-Detecting Experiments for Sequential Circuits, Proc. 5th Annual Symposium on Switching Circuit Theory and Logical Design, NJ, 1964
 
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Collaborative Colleagues:
Christopher Robinson-Mallett: colleagues
Peter Liggesmeyer: colleagues
Tilo Mücke: colleagues
Ursula Goltz: colleagues