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Nonintrusive precision instrumentation of microcontroller software
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Volume 40 ,  Issue 7  (July 2005) table of contents
Proceedings of the 2005 ACM SIGPLAN/SIGBED conference on Languages, compilers, and tools for embedded systems
SESSION: System design issues table of contents
Pages: 59 - 68  
Year of Publication: 2005
ISSN:0362-1340
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ACM  New York, NY, USA
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Downloads (6 Weeks): 5,   Downloads (12 Months): 42,   Citation Count: 10
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ABSTRACT

Debugging, testing, and profiling microcontroller programs are notoriously difficult. The lack of supporting software such as an operating system, a narrow interface to the hardware chip, and delicately timed sequences of code present significant challenges which can be exacerbated by the presence of additional debugging or profiling code. In this paper we present a solution to the precision instrumentation problem for microcontroller code that is based upon our open, flexible simulator framework, Avrora. Our simulator preserves all timing and behavior of the instrumented program while allowing precision measurement of application-specific quantities.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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Bryan M. Cantrill, Michael W. Shapiro, and Adam H. Leventhal. Dynamic instrumentation of production systems. In Proceedings of USENIX Annual Technical Conference, General Track, pages 15--28, 2004.
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Jonathan Polley, Dionysys Blazakis, Jonathan McGee, Dan Rusk, John S. Baras, and Manish Karir. ATEMU: A fine-grained sensor network simulator. In Proceedings of SECON'04, IEEE Conference on Sensor and Ad Hoc Communications and Networks, 2004.
 
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Theodore A. Roth. Simulavr: an AVR simulator. http://savannah.nongnu.org/projects/simulavr.
 
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Ben L. Titzer, Daniel K. Lee, and Jens Palsberg. Avrora: Scalable sensor network simulation with precise timing. In Proceedings of IPSN'05, International Conference on Information Processing in Sensor Networks, 2005. To appear.

CITED BY  10

Collaborative Colleagues:
Ben L. Titzer: colleagues
Jens Palsberg: colleagues