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Testing hierarchical systems
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Source Symposium on Discrete Algorithms archive
Proceedings of the sixteenth annual ACM-SIAM symposium on Discrete algorithms table of contents
Vancouver, British Columbia
SESSION: Session 12B table of contents
Pages: 1126 - 1135  
Year of Publication: 2005
ISBN:0-89871-585-7
Authors
Damon Mosk-Aoyama  Stanford University
Mihalis Yannakakis  Columbia University
Sponsors
SIGACT: ACM Special Interest Group on Algorithms and Computation Theory
: SIAM Activity Group on Discrete Mathematics
Publisher
Society for Industrial and Applied Mathematics  Philadelphia, PA, USA
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ABSTRACT

We investigate the testing of hierarchical (modular) systems, in which individual modules are modeled by finite state machines. Given a hierarchical system, we are interested in finding a small set of tests that exercises all the transitions of the system. We present tight approximation algorithms and hardness results for the problem. Our techniques extend to other criteria and metrics.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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L. Apfelbaum. Automated functional test generation. In Proc. IEEE Autotestcon Conference, 1995.
 
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D. Lee and M. Yannakakis. Principles and methods of testing finite state machines - a survey. Proceedings of the IEEE, 84:1090--1126, 1996.
 
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uBET. http://cm.bell-labs.com/cm/cs/what/ubet.
Collaborative Colleagues:
Damon Mosk-Aoyama: colleagues
Mihalis Yannakakis: colleagues