On the need for statistical timing analysis

ABSTRACT

Traditional corner analysis fails to guarantee a target yield for a given performance metric. However, recently proposed solutions, in the form of statistical timing analysis, which work by propagating delay distributions, do not conform to modern design methodology. Instead, new statistical techniques are needed to modify corner analysis in ways that overcome its weaknesses without violating usage models of timing tools in modern flows.

REFERENCES

• 1: Manidip Sengupta , Sharad Saxena , Lidia Daldoss , Glen Kramer , Sean Minehane , Jianjun Cheng, Application Specific Worst Case Corners Using Response Surfaces and Statistical Models, Proceedings of the 5th International Symposium on Quality Electronic Design, p.351-356, March 22-24, 2004
• 2: S. B. Samaan, The impact of device parameter variations on the frequency and performance of VLSI chips, Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design, p.343-346, November 07-11, 2004 [doi>10.1109/ICCAD.2004.1382598]
• 3: Farid N. Najm , Noel Menezes, Statistical timing analysis based on a timing yield model, Proceedings of the 41st annual conference on Design automation, June 07-11, 2004, San Diego, CA, USA [doi>10.1145/996566.996696]

INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS

General Terms:
Algorithms, Design

Keywords:
statistical timing analysis, variability