| Microarchitecture-aware floorplanning using a statistical design of experiments approach |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 42nd annual Design Automation Conference
table of contents
Anaheim, California, USA
SESSION: New approaches to physical design problems
table of contents
Pages: 579 - 584
Year of Publication: 2005
ISBN:1-59593-058-2
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Downloads (6 Weeks): 5, Downloads (12 Months): 38, Citation Count: 6
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ABSTRACT
Since across-chip interconnect delays can exceed a clock cycle in nanometer technologies, it has become essential in high performance designs to add flip-flops on wires with multi-cycle delays. Although such a wire pipelining strategy allows higher operating frequencies, it can reduce the delivered performance of a microarchitecture, since the extra flip-flops inserted may increase the operation latencies and stall cycles. Moreover, the addition of latencies on some wires can have a large impact on the overall performance while other wires are relatively insensitive to additional latencies. This varying sensitivity suggests the need for a throughput-aware strategy for pipelining the interconnects that interacts closely with the physical design step, which determines the lengths of these multicycle wires. We use a statistical design of experiments strategy based on a multifactorial design, which intelligently uses a limited number of simulations to rank the importance of the wires. When applied at the floorplanning level, our results show improvements both in the overall system performance and in the total wire length when compared with an existing technique.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 6
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Michael Healy , Mario Vittes , Mongkol Ekpanyapong , Chinnakrishnan Ballapuram , Sung Kyu Lim , Hsien-Hsin S. Lee , Gabriel H. Loh, Microarchitectural floorplanning under performance and thermal tradeoff, Proceedings of the conference on Design, automation and test in Europe: Proceedings, March 06-10, 2006, Munich, Germany
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