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An exact jumper insertion algorithm for antenna effect avoidance/fixing
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 42nd annual Design Automation Conference table of contents
Anaheim, California, USA
SESSION: Statistical optimization and manufacturability table of contents
Pages: 325 - 328  
Year of Publication: 2005
ISBN:1-59593-058-2
Authors
Bor-Yiing Su  National Taiwan University, Taipei, Taiwan
Yao-Wen Chang  National Taiwan University, Taipei, Taiwan
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 3,   Downloads (12 Months): 19,   Citation Count: 2
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ABSTRACT

As the process technology enters the nanometer era, reliability has become a major concern in the design and manufacturing of VLSI circuits. In this paper we focus on one reliability issue-jumper insertion in routing trees for avoiding/fixing antenna effect violations at the routing/post-layout stages. We formulate the jumper insertion for antenna avoidance/fixing as a tree-cutting problem. We show that the tree-cutting problem exhibits the properties of optimal substructures and greedy choices. With these properties, we present an O(V lg V)-time exact jumper insertion algorithm that uses the optimum number of jumpers to avoid/fix the antenna violations in a routing tree with V vertices. Experimental results show the superior effectiveness and efficiency of our algorithm.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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H. Shin, C. -C. King, and C. Hu, "Thin Oxide Damage by plasma etching and ashing process", Proc. IRPS, 1992.
 
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H. Watanabe, et al., "A wafer level monitoring method for plasma-charging damage using antenna PMOSFET test structure," IEEE Trans. Semiconductor manufacturing, vol. 10, no. 2, May. 1997.


Collaborative Colleagues:
Bor-Yiing Su: colleagues
Yao-Wen Chang: colleagues