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ABSTRACT
Power minimization under variability is formulated as a rigorous statistical robust optimization program with a guarantee of power and timing yields. Both power and timing metrics are treated probabilistically. Power reduction is performed by simultaneous sizing and dual threshold voltage assignment. An extremely fast run-time is achieved by casting the problem as a second-order conic problem and solving it using efficient interior-point optimization methods. When compared to the deterministic optimization, the new algorithm, on average, reduces static power by 31% and total power by 17% without the loss of parametric yield. The run time on a variety of public and industrial benchmarks is 30X faster than other known statistical power minimization algorithms.
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Sarvesh Bhardwaj , Sarma Vrudhula , Praveen Ghanta , Yu Cao, Modeling of intra-die process variations for accurate analysis and optimization of nano-scale circuits, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
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