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An efficient algorithm for statistical minimization of total power under timing yield constraints
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Source Annual ACM IEEE Design Automation Conference archive
Proceedings of the 42nd annual Design Automation Conference table of contents
Anaheim, California, USA
SESSION: Statistical optimization and manufacturability table of contents
Pages: 309 - 314  
Year of Publication: 2005
ISBN:1-59593-058-2
Authors
Murari Mani  University of Texas, Austin
Anirudh Devgan  Magma Design Automation
Michael Orshansky  University of Texas, Austin
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 18,   Downloads (12 Months): 85,   Citation Count: 33
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ABSTRACT

Power minimization under variability is formulated as a rigorous statistical robust optimization program with a guarantee of power and timing yields. Both power and timing metrics are treated probabilistically. Power reduction is performed by simultaneous sizing and dual threshold voltage assignment. An extremely fast run-time is achieved by casting the problem as a second-order conic problem and solving it using efficient interior-point optimization methods. When compared to the deterministic optimization, the new algorithm, on average, reduces static power by 31% and total power by 17% without the loss of parametric yield. The run time on a variety of public and industrial benchmarks is 30X faster than other known statistical power minimization algorithms.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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Y. Taur et al., "CMOS scaling into the nanometer regime," Proc. of the IEEE, no. 4, 1997, pp. 486--504.
3
4
5
6
7
 
8
9
10
11
12
13
 
14
 
15
J. Fishburn and A. Dunlop, "TILOS: A Posynomial Programming Approach to Transistor Sizing," Proc. of ICCAD, 1985, pp. 326--328.
 
16
D. Markovic et al., "Methods for true energy-performance optimization," J. of Solid-State Circuits, 2004, pp. 1282--1293.
 
17
V. Sundararajan et al., "Fast and Exact Transistor sizing Based on Iterative Relaxation," IEEE Trans. on CAD, vol. 21, 2002, pp.568--581.
18
 
19
C. Chatfield, Introduction to Multivariate analysis, Chapman and Hall, 1980.
 
20
 
21
Kim et al., "A Heuristic for Optimizing Stochastic Activity Networks with Applications to Statistical Circuit Sizing", preprint.
 
22
A. Prekopa, Stochastic Programming, Kluwer Academic, 1995
 
23
 
24
Y. Cao et al., "New paradigm of predictive MOSFET and interconnect modeling for early circuit design," Proc. of IEEE CICC, 2000, pp. 201--204.
 
25
M. Pelgrom et al., Matching Properties of MOS Transistors, IEEE Journal of Solid-State Circuits, vol. 24, 1989, pp. 1433--1440.

CITED BY  33

Collaborative Colleagues:
Murari Mani: colleagues
Anirudh Devgan: colleagues
Michael Orshansky: colleagues