SEU tolerant device, circuit and processor design

ABSTRACT

Development of highly reliable and available systems requires consideration of the occurrence of single event upsets, the effects they have on system performance, and strategies for their prevention and mitigation. Methods of systems engineering process and the application and validation of techniques for fault tolerance are discussed as elements in the elimination and mitigation of single event upsets.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.8 Performance and Reliability
      B.8.1 Reliability, Testing, and Fault-Tolerance

General Terms:
Reliability

Keywords:
error detection and correction coding, fault avoidance, fault masking, fault tolerant systems, modular redundancy, radiation effects, single event upset, soft error rate, temporal redundancy