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Fast and robust detection of crest lines on meshes
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Source ACM Symposium on Solid and Physical Modeling archive
Proceedings of the 2005 ACM symposium on Solid and physical modeling table of contents
Cambridge, Massachusetts
Pages: 227 - 232  
Year of Publication: 2005
ISBN:1-59593-015-9
Authors
Shin Yoshizawa  MPI Informatik, Saarbrücken, Germany
Alexander Belyaev  MPI Informatik, Saarbrücken, Germany
Hans-Peter Seidel  MPI Informatik, Saarbrücken, Germany
Sponsor
SIGGRAPH: ACM Special Interest Group on Computer Graphics and Interactive Techniques
Publisher
ACM  New York, NY, USA
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ABSTRACT

We propose a fast and robust method for detecting crest lines on surfaces approximated by dense triangle meshes. The crest lines, salient surface features defined via first- and second-order curvature derivatives, are widely used for shape matching and interrogation purposes. Their practical extraction is difficult because it requires good estimation of high-order surface derivatives. Our approach to the crest line detection is based on estimating the curvature tensor and curvature derivatives via local polynomial fitting.Since the crest lines are not defined in the surface regions where the surface focal set (caustic) degenerates, we introduce a new thresholding scheme which exploits interesting relationships between curvature extrema, the so-called MVS functional of Moreton and Sequin, and Dupin cyclides,An application of the crest lines to adaptive mesh simplification is also considered.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  13
Collaborative Colleagues:
Shin Yoshizawa: colleagues
Alexander Belyaev: colleagues
Hans-Peter Seidel: colleagues