| Utilizing don't care states in SAT-based bounded sequential problems |
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Great Lakes Symposium on VLSI
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Proceedings of the 15th ACM Great Lakes symposium on VLSI
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Chicago, Illinois, USA
SESSION: Verification
table of contents
Pages: 264 - 269
Year of Publication: 2005
ISBN:1-59593-057-4
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ABSTRACT
Boolean Satisfiability (SAT) solvers are popular engines used throughout the verification world. Bounded sequential problems such as bounded model checking and bounded sequential equivalence checking rely on fast and robust SAT solvers. In this work, we introduce a technique that improves the performance of the underlying SAT solver for bounded sequential problems by taking advantage of a design's don't care states. We develop cost effective methods of filtering, replicating and applying the don't care states to the original problem thus reducing the search space. Experiments demonstrate the effectiveness of the proposed method on ISCAS'89 benchmarks.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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A. Biere, A. Cimatti, E.M. Clarke, O. Strichman and Y. Zhu, "Bounded Model Checking", in Vol. 58 Advances in Computer, Academic Press, 2003.
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2
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3
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4
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5
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Shankar G. Govindaraju , David L. Dill , Alan J. Hu , Mark A. Horowitz, Approximate reachability with BDDs using overlapping projections, Proceedings of the 35th annual conference on Design automation, p.451-456, June 15-19, 1998, San Francisco, California, United States
[doi> 10.1145/277044.277169]
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6
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Aarti Gupta , Malay Ganai , Chao Wang , Zijiang Yang , Pranav Ashar, Learning from BDDs in SAT-based bounded model checking, Proceedings of the 40th conference on Design automation, June 02-06, 2003, Anaheim, CA, USA
[doi> 10.1145/775832.776040]
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7
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A. Gupta, M. Ganai, C. Wang, Z. Yang, P. Ashar, "Abstraction and BDDs Complement SAT-Based BMC in DiVer", Proc. of CAV, pp. 206--209, 2003.
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8
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9
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T. Larrabee, "Test Pattern Generation Using Boolean Satisfiability," in IEEE Trans. on CAD, vol. 11, no. 1, pp. 4--15, 1992.
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10
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11
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In-Ho Moon , Jae-Young Jang , Gary D. Hachtel , Fabio Somenzi , Jun Yuan , Carl Pixley, Approximate reachability don't cares for CTL model checking, Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design, p.351-358, November 08-12, 1998, San Jose, California, United States
[doi> 10.1145/288548.289053]
|
 |
12
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Matthew W. Moskewicz , Conor F. Madigan , Ying Zhao , Lintao Zhang , Sharad Malik, Chaff: engineering an efficient SAT solver, Proceedings of the 38th conference on Design automation, p.530-535, June 2001, Las Vegas, Nevada, United States
[doi> 10.1145/378239.379017]
|
 |
13
|
Kavita Ravi , Kenneth L. McMillan , Thomas R. Shiple , Fabio Somenzi, Approximation and decomposition of binary decision diagrams, Proceedings of the 35th annual conference on Design automation, p.445-450, June 15-19, 1998, San Francisco, California, United States
[doi> 10.1145/277044.277168]
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14
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|
| |
15
|
F. Somenzi, "CUDD: CU decision diagram package", Public software, Colorado University, Boulder, 1997.
|
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16
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|
| |
17
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J.P.M. Silva and T. Glass, "Combinational Equivalence Checking using Satisfiability and Recursive Learning", Proc. of IEEE DATE, pp. 145--149, 1999.
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18
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D. Stoffel, M. Wedler, P. Warkentin and W. Kunz, "Structural FSM Traversal", in IEEE Trans. on CAD, vol. 23, no. 5, pp. 598--619, 2004.
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