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Utilizing don't care states in SAT-based bounded sequential problems
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Source Great Lakes Symposium on VLSI archive
Proceedings of the 15th ACM Great Lakes symposium on VLSI table of contents
Chicago, Illinois, USA
SESSION: Verification table of contents
Pages: 264 - 269  
Year of Publication: 2005
ISBN:1-59593-057-4
Authors
Sean Safarpour  University of Toronto, Toronto, Canada
Görschwin Fey  Bremen University, Bremen, Germany
Andreas Veneris  University of Toronto, Toronto, Canada
Rolf Drechsler  Bremen University, Bremen, Germany
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

Boolean Satisfiability (SAT) solvers are popular engines used throughout the verification world. Bounded sequential problems such as bounded model checking and bounded sequential equivalence checking rely on fast and robust SAT solvers. In this work, we introduce a technique that improves the performance of the underlying SAT solver for bounded sequential problems by taking advantage of a design's don't care states. We develop cost effective methods of filtering, replicating and applying the don't care states to the original problem thus reducing the search space. Experiments demonstrate the effectiveness of the proposed method on ISCAS'89 benchmarks.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Sean Safarpour: colleagues
Görschwin Fey: colleagues
Andreas Veneris: colleagues
Rolf Drechsler: colleagues