| An improved direct boundary element method for substrate coupling resistance extraction |
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Great Lakes Symposium on VLSI
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Proceedings of the 15th ACM Great Lakes symposium on VLSI
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Chicago, Illinois, USA
POSTER SESSION: Poster session 1
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Pages: 84 - 87
Year of Publication: 2005
ISBN:1-59593-057-4
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ABSTRACT
It is important to model the substrate coupling for mixed-signal circuit designs today. This paper presents an improved direct boundary element method (DBEM) for substrate resistance calculation, where only the boundary of substrate volumes is discretized and only the free-space Green function is used. At first, we discard some inessential unknowns to compress the linear system without accuracy loss. Then we make the coefficient matrix sparser. In this way, solving the linear system is greatly accelerated. Experiments on various substrates validate that DBEM is several to tens of times faster than DCT-accelerated Green's function methods and the eigendecomposition method, while preserving high accuracy. Besides, another experiment shows that this method is versatile for irregular substrates.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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