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Interconnect delay minimization through interlayer via placement in 3-D ICs
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Source Great Lakes Symposium on VLSI archive
Proceedings of the 15th ACM Great Lakes symposium on VLSI table of contents
Chicago, Illinois, USA
SESSION: Interconnect table of contents
Pages: 20 - 25  
Year of Publication: 2005
ISBN:1-59593-057-4
Authors
Vasilis F. Pavlidis  University of Rochester, Rochester, New York
Eby G. Friedman  University of Rochester, Rochester, New York
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 15,   Downloads (12 Months): 55,   Citation Count: 3
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ABSTRACT

The dependence of the propagation delay of the interlayer 3-D interconnects on the vertical through via location and length is investigated. For a variable vertical through via location, with fixed vertical length, the optimum vertical through via location that minimizes the propagation delay of an interconnect line connecting two circuits on different planes is determined. The optimum vertical through via location and length or, equivalently, the number of physical planes traversed by the vertical through via, are determined for varying the placement of the connected circuits. Design expressions for the optimal via locations and lengths have been developed to support placement and routing algorithms for 3-D ICs.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Vasilis F. Pavlidis: colleagues
Eby G. Friedman: colleagues