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A remeshing approach to multiresolution modeling
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Source ACM International Conference Proceeding Series; Vol. 71 archive
Proceedings of the 2004 Eurographics/ACM SIGGRAPH symposium on Geometry processing table of contents
Nice, France
SESSION: Session 6 table of contents
Pages: 185 - 192  
Year of Publication: 2004
ISBN ~ ISSN:1727-8384 , 3-905673-13-4
Authors
Mario Botsch  RWTH Aachen University
Leif Kobbelt  RWTH Aachen University
Sponsor
Eurographics: Eurographics Association
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 8,   Downloads (12 Months): 73,   Citation Count: 8
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ABSTRACT

Providing a thorough mathematical foundation, multiresolution modeling is the standard approach for global surface deformations that preserve fine surface details in an intuitive and plausible manner. A given shape is decomposed into a smooth low-frequency base surface and high-frequency detail information. Adding these details back onto a deformed version of the base surface results in the desired modification. Using a suitable detail encoding, the connectivity of the base surface is not restricted to be the same as that of the original surface. We propose to exploit this degree of freedom to improve both robustness and efficiency of multiresolution shape editing.In several approaches the modified base surface is computed by solving a linear system of discretized Laplacians. By remeshing the base surface such that the Voronoi areas of its vertices are equalized, we turn the unsymmetric surface-related linear system into a symmetric one, such that simpler, more robust, and more efficient solvers can be applied. The high regularity of the remeshed base surface further removes numerical problems caused by mesh degeneracies and results in a better discretization of the Laplacian operator.The remeshing is performed on the low-frequency base surface only, while the connectivity of the original surface is kept fixed. Hence, this functionality can be encapsulated inside a multiresolution kernel and is thus completely hidden from the user.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  8
Collaborative Colleagues:
Mario Botsch: colleagues
Leif Kobbelt: colleagues