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Signal-specialized parameterization for piecewise linear reconstruction
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Proceedings of the 2004 Eurographics/ACM SIGGRAPH symposium on Geometry processing table of contents
Nice, France
SESSION: Session 2 table of contents
Pages: 55 - 64  
Year of Publication: 2004
ISBN ~ ISSN:1727-8384 , 3-905673-13-4
Authors
Geetika Tewari  Harvard University, Cambridge, MA
John Snyder  Microsoft Research, Redmond, WA
Pedro V. Sander  ATI Research, Marlborough, MA
Steven J. Gortler  Harvard University, Cambridge, MA
Hugues Hoppe  Microsoft Research, Redmond, WA
Sponsor
Eurographics: Eurographics Association
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 8,   Downloads (12 Months): 22,   Citation Count: 6
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ABSTRACT

We propose a metric for surface parameterization specialized to its signal that can be used to create more efficient, high-quality texture maps. Derived from Taylor expansion of signal error, our metric predicts the signal approximation error - the difference between the original surface signal and its reconstruction from the sampled texture. Unlike previous methods, our metric assumes piecewise-linear reconstruction, and thus makes a good approximation to bilinear reconstruction employed in graphics hardware. We achieve significant savings in texture area for a desired signal accuracy compared to the signal-specialized parameterization metric proposed by Sander et al. in the 2002 Eurographics Workshop on Rendering.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Geetika Tewari: colleagues
John Snyder: colleagues
Pedro V. Sander: colleagues
Steven J. Gortler: colleagues
Hugues Hoppe: colleagues