Multilevel full-chip routing with testability and yield enhancement

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Multilevel full-chip routing with testability and yield enhancement

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International Workshop on System-Level Interconnect Prediction archive
Proceedings of the 2005 international workshop on System level interconnect prediction table of contents

San Francisco, California, USA

SESSION: Interconnect optimization table of contents

Pages: 29 - 36

Year of Publication: 2005

ISBN:1-59593-033-7

Authors

Katherine Shu-Min Li	National Chiao Tung University, Hsichu, Taiwan
Chung-Len Lee	National Chiao Tung University, Hsichu, Taiwan
Yao-Wen Chang	National Taiwan University, Taipei, Taiwan
Chauchin Su	National Chiao Tung University, Hsichu, Taiwan
Jwu-E Chen	National Central University, Chungli, Taiwan

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ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation

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ACM New York, NY, USA

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Downloads (6 Weeks): 1, Downloads (12 Months): 12, Citation Count: 0

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ABSTRACT

We propose a multilevel full-chip routing algorithm that improves testability and diagnosability, manufacturability, and signal integrity for yield enhancement. Two major issues are addressed. (1) The oscillation ring (OR) test and its diagnosis scheme for interconnect based on the IEEE P1500 are integrated into the multilevel routing framework to achieve testability enhancement. (2) We present a heuristic to balance routing congestion to optimize the multiple-fault probability, chemical mechanic polishing (CMP) and optical proximity correction (OPC) induced manufacturability, and crosstalk effects, for yield improvement. Experimental results on the MCNC benchmark circuits show that the proposed OR method achieves 100% fault coverage and the maximal diagnosis resolution for interconnects, and the multilevel routing algorithm effectively balances the routing density to achieve 100% routing completion. Compared with [14], the experimental results show that our router improves the maximal congestion by 1.24X--6.11X in runtime speedup by 1.08X--7.66X, and improves the average congestion by 1.00X--4.52X with the improved congestion deviation by 1.37X--5.55X.

REFERENCES

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