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REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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AS
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Agrawal, V. D. and Seth, S. C. {1988}. Test Generation for VLSI Chips, Computer Society Press, Washington, DC.
|
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ADLU
|
Aho, A. V., Dabhura, A. T., Lee, D. and Uyar, M. U. {1988}. An Optimization Technique for Protocol Conformance Test Generation Based on UIO Sequences and Rural Chinese Postman Tours, to appear in IEEE Trans. on Communication, an early version published in Proc. IFIP WG 6.1 Eighth Intl. Syrup. on Protocol Specification, Testing and Verification, pp. 75-86, Atlantic City, N.J.
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ASU
|
Alfred V. Aho , Ravi Sethi , Jeffrey D. Ullman, Compilers: principles, techniques, and tools, Addison-Wesley Longman Publishing Co., Inc., Boston, MA, 1986
|
| |
AK+
|
Aleliunas, R., Karp, R. M., Lipton, R. J., Lovasz, L., and Rackoff, C. {1979}. Random Walks, Universal Traversal Sequences, and the Complexity of Maze Problems, in Proc. 20th Ann. Syrup. on Foundations of Computer Science, pp. 218-223.
|
| |
An
|
|
 |
CVI
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W. Y. L. Chan , C. T. Vuong , M. R. Otp, An improved protocol test generation procedure based on UIOS, Symposium proceedings on Communications architectures & protocols, p.283-294, September 25-27, 1989, Austin, Texas, United States
|
| |
Ch
|
Chow, T. S. {1978}. Testing Software Design Modeled by Finite-State Machines, in IEEE Trans. on Software Engineering, Vol. SE-4, No. 3, pp. 178-187.
|
| |
FM
|
Friedman, A. D. and Menon, P, R. {1971}. Fault Detection in Digital Circuits, Prentice-Hall, Inc., Englewood Cliffs, New Jersey.
|
| |
G1
|
Gill, A. {1961}. State-Identification Experiments in Finite Automata, in Information and Control, Vol. 4, pp. 132-154.
|
| |
G2
|
Gill, A. {1962}. Introduction to the Theory of Finitestate Machines, McGraw-Hill Book Company, New Yore
|
| |
Go
|
Gobershtein, S. M. {1974}. Check Words for the States of a Finite Automaton, in Kibernetika, No. 1, pp. 46-49.
|
| |
He
|
Hennie, F. C. {1964}. Fault Detecting Experiments for Sequential Circuits, in Proc. Fifth Ann. Syrup. Switching Circuit Theory and Logical Design, pp. 95-110, Princeton, N. J.
|
| |
Ho
|
|
| |
Hp
|
Hopcroft, J. E. {1971}. An n log n ,Mgorithm for Minimizing States in a Finite Automaton, in Theory of Machines and Computations, Z. Kohavi and A. Paz (eds.), pp. 189-196, Academic Press, New York.
|
| |
Hs
|
Hsieh, E. P. {1971}. Checking Experiments for Sequential Machines, in IEEE Trar#. .on Computer, Vol. C-20, No. 10, pp. 1152-1166.
|
| |
Hu
|
Huffrnaxt, D. A. {1964}. Canonica#l Forms for Information-Lossless Finite-State Logical Machines, in Sequential Machines: Selected Papers, E. F. Moore, ed., Addison-Wesley, Reading Mass.
|
| |
KK
|
Kohavi, I. and Kohavi, Z. {1968}. Variable-Length Distinguishing Sequences and Their Application to the Design of Fault-Detection Experiments, in IEEE Trans. on Computer, Vol. C-17, pp. 792.-795.
|
| |
Ko
|
|
| |
LY
|
Lee, D. and Yarmakakis, M. {1990}. An Algorithm for Minimizing Extended Finite State Machines, in preparation.
|
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LLC
|
Logical Link Control {1989}. International Standard ISO 8802-2, IEEE Std. 802.2, The Institute of Electrical and Electronics Engineers, Inc.
|
| |
Mo
|
Moore, E. F. {1956}. Gedanken-experiments on Sequential Machines, in Automata Studies, Annals of Mathematics Studies, No. 34, pp. 129-153, Princeton University Press, Princeton, N. J.
|
| |
NT
|
Naito, S. and Tsunoyama, M. {1981}. Fault Detection for Sequential Machines by Transitions Tours, in Proc. IEEE Fault Tolerant Comput. Syrup., IEEE Computer Society Press, pp. 238-243.
|
 |
Ni
|
|
 |
RS
|
|
| |
SD
|
|
| |
Se
|
Seitz, C. L. {1971}. An Approach Ix> Designing Checking Experiments Based on a Dynamic Model, in Theory of Machines and Computatior#, Z. Kohavi and A. Paz eds., Academic Press, New York.
|
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SLT
|
|
| |
SL
|
|
| |
So
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Sokolovskii, M. N. {1971}. Diagnostic Experiments with Automata, in Kibernetika, No. 6, pp. 44-49.
|
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Va
|
Vasilevskii, M. P. {1973}. Failure Diagnosis of Automata, in Kibernetika, No, 4, pp. 98-108,
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YU
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CITED BY 9
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Hana Ševčíková , Alan Borning , David Socha , Wolf-Gideon Bleek, Automated testing of stochastic systems: a statistically grounded approach, Proceedings of the 2006 international symposium on Software testing and analysis, July 17-20, 2006, Portland, Maine, USA
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