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Testing finite state machines
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Source Annual ACM Symposium on Theory of Computing archive
Proceedings of the twenty-third annual ACM symposium on Theory of computing table of contents
New Orleans, Louisiana, United States
Pages: 476 - 485  
Year of Publication: 1991
ISBN:0-89791-397-3
Authors
Mihalis Yannakakis  AT&T Bell Labs., Murray Hill, NJ
Editors
David Lee  AT&T Bell Labs., Murray Hill, NJ
Sponsor
SIGACT: ACM Special Interest Group on Algorithms and Computation Theory
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 5,   Downloads (12 Months): 50,   Citation Count: 9
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
AS
Agrawal, V. D. and Seth, S. C. {1988}. Test Generation for VLSI Chips, Computer Society Press, Washington, DC.
 
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Aho, A. V., Dabhura, A. T., Lee, D. and Uyar, M. U. {1988}. An Optimization Technique for Protocol Conformance Test Generation Based on UIO Sequences and Rural Chinese Postman Tours, to appear in IEEE Trans. on Communication, an early version published in Proc. IFIP WG 6.1 Eighth Intl. Syrup. on Protocol Specification, Testing and Verification, pp. 75-86, Atlantic City, N.J.
 
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Aleliunas, R., Karp, R. M., Lipton, R. J., Lovasz, L., and Rackoff, C. {1979}. Random Walks, Universal Traversal Sequences, and the Complexity of Maze Problems, in Proc. 20th Ann. Syrup. on Foundations of Computer Science, pp. 218-223.
 
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Ch
Chow, T. S. {1978}. Testing Software Design Modeled by Finite-State Machines, in IEEE Trans. on Software Engineering, Vol. SE-4, No. 3, pp. 178-187.
 
FM
Friedman, A. D. and Menon, P, R. {1971}. Fault Detection in Digital Circuits, Prentice-Hall, Inc., Englewood Cliffs, New Jersey.
 
G1
Gill, A. {1961}. State-Identification Experiments in Finite Automata, in Information and Control, Vol. 4, pp. 132-154.
 
G2
Gill, A. {1962}. Introduction to the Theory of Finitestate Machines, McGraw-Hill Book Company, New Yore
 
Go
Gobershtein, S. M. {1974}. Check Words for the States of a Finite Automaton, in Kibernetika, No. 1, pp. 46-49.
 
He
Hennie, F. C. {1964}. Fault Detecting Experiments for Sequential Circuits, in Proc. Fifth Ann. Syrup. Switching Circuit Theory and Logical Design, pp. 95-110, Princeton, N. J.
 
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Hopcroft, J. E. {1971}. An n log n ,Mgorithm for Minimizing States in a Finite Automaton, in Theory of Machines and Computations, Z. Kohavi and A. Paz (eds.), pp. 189-196, Academic Press, New York.
 
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Hsieh, E. P. {1971}. Checking Experiments for Sequential Machines, in IEEE Trar#. .on Computer, Vol. C-20, No. 10, pp. 1152-1166.
 
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Huffrnaxt, D. A. {1964}. Canonica#l Forms for Information-Lossless Finite-State Logical Machines, in Sequential Machines: Selected Papers, E. F. Moore, ed., Addison-Wesley, Reading Mass.
 
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Kohavi, I. and Kohavi, Z. {1968}. Variable-Length Distinguishing Sequences and Their Application to the Design of Fault-Detection Experiments, in IEEE Trans. on Computer, Vol. C-17, pp. 792.-795.
 
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LY
Lee, D. and Yarmakakis, M. {1990}. An Algorithm for Minimizing Extended Finite State Machines, in preparation.
 
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Logical Link Control {1989}. International Standard ISO 8802-2, IEEE Std. 802.2, The Institute of Electrical and Electronics Engineers, Inc.
 
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Moore, E. F. {1956}. Gedanken-experiments on Sequential Machines, in Automata Studies, Annals of Mathematics Studies, No. 34, pp. 129-153, Princeton University Press, Princeton, N. J.
 
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Naito, S. and Tsunoyama, M. {1981}. Fault Detection for Sequential Machines by Transitions Tours, in Proc. IEEE Fault Tolerant Comput. Syrup., IEEE Computer Society Press, pp. 238-243.
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Se
Seitz, C. L. {1971}. An Approach Ix> Designing Checking Experiments Based on a Dynamic Model, in Theory of Machines and Computatior#, Z. Kohavi and A. Paz eds., Academic Press, New York.
 
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So
Sokolovskii, M. N. {1971}. Diagnostic Experiments with Automata, in Kibernetika, No. 6, pp. 44-49.
 
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Vasilevskii, M. P. {1973}. Failure Diagnosis of Automata, in Kibernetika, No, 4, pp. 98-108,
YU

CITED BY  9

Collaborative Colleagues:
Mihalis Yannakakis: colleagues
David Lee: colleagues