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Process equipment modeling: application of cluster tool modeling to a 300 mm fab simulation
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Source Winter Simulation Conference archive
Proceedings of the 35th conference on Winter simulation: driving innovation table of contents
New Orleans, Louisiana
SESSION: Semiconductor manufacturing table of contents
Pages: 1394 - 1375  
Year of Publication: 2003
ISBN:0-7803-8132-7
Authors
Sameer T. Shikalgar  IBM Microelectronics Division, East Fishkill, NY
David Fronckowiak  IBM Microelectronics Division, East Fishkill, NY
Edward A. MacNair  IBM T. J. Watson Research Center, Yorktown Heights, NY
Sponsors
INFORMS/CS : Institute for Operations Research and the Management Sciences/College on Simulation
NIST : National Institute of Standards and Technology
IEEE/SMCS : Institute of Electrical and Electronics Engineers/Systems, Man, and Cybernetics Society
ACM: Association for Computing Machinery
(SCS) : The Society for Modeling and Simulation International
SIGSIM: ACM Special Interest Group on Simulation and Modeling
IIE : Institute of Industrial Engineers
IEEE/CS : Institute of Electrical and Electronics Engineers/Computer Society
ASA : American Statistical Association
Publisher
Winter Simulation Conference 
Bibliometrics
Downloads (6 Weeks): 0,   Downloads (12 Months): 2,   Citation Count: 1
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abstract   references   cited by   collaborative colleagues  

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ABSTRACT

300 mm semiconductor wafer fabrication facilities, like conventional semiconductor fabs, contain many different types of tools. In this paper we discuss a realistic way of representing cluster tools in a simulation model of the entire line. A more realistic representation of cluster tools results in greater accuracy in the output of the simulation model.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Brooks Automation, Inc., AutoSimulations Division. 2001. AutoSched AP Customization Guide v 7.0.
 
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Campbell, P., and G. Laitinen. 1997. Overhead Intrabay Automation and Microstocking - a virtual fab case study. In Proceedings of the IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop, 368--372. Cambridge, MA.
 
3
Campbell, P., and M. Norman. 1998. Microstocking and Fab Throughput. In Proceedings of the AutoSimulations '98 Symposium, 101--106. Bountiful, UT.
 
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Campbell, P., and M. Norman. 1999. Simulation Used To Model And Test Improvements In 300 Mm Fab Throughput. Available online via <http://www.semicondutoronline.com>.
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Norman, M., and J. Barksdale. 1999. Integrated Manufacturing and Material Handling Simulation Modeling. In Proceedings of the SIMULATION Solutions '99 Conference. Mesa, AZ.
 
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Collaborative Colleagues:
Sameer T. Shikalgar: colleagues
David Fronckowiak: colleagues
Edward A. MacNair: colleagues