ACM Home Page
Please provide us with feedback. Feedback
A leakage-energy-reduction technique for highly-associative caches in embedded systems
Full text PdfPdf (544 KB)
Source ACM SIGARCH Computer Architecture News archive
Volume 32 ,  Issue 3  (June 2004) table of contents
Special issue: MEDEA-2003 workshop
Pages: 50 - 54  
Year of Publication: 2004
ISSN:0163-5964
Also published in ...
Authors
Akihito Sakanaka  Panasonic Communications
Seiichirou Fujii  Kyushu Institute of Technology
Toshinori Sato  PRESTO, JST
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 17,   Citation Count: 2
Additional Information:

abstract   references   cited by   index terms   collaborative colleagues  

Tools and Actions: Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/1024295.1024302
What is a DOI?

ABSTRACT

Power consumption is becoming one of the most important constraints for microprocessor design in nanometer scale technologies. Especially, as the transistor supply voltage and threshold voltage are scaled down, leakage energy consumption is increased even when the transistor is not switching. This paper proposes a simple technique to reduce the static energy. The key idea of our approach is to allow the ways within a cache to be accessed at different speeds and to place infrequently accessed data into the slow ways. We use dual-Vt technique to realize the non-uniform set-associative cache, and propose a simple replacement policy to reduce average access latency. Experimental results on 32-way set-associative caches demonstrate that any severe increase in clock cycles to execute application programs is not observed and significant static energy reduction can be achieved, resulting in the improvement of energy-delay product.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
2
 
3
D. Burger, "Technology scaling challenges for microprocessors and systems," Invited Lecture, COOL Chips V, 2002.
4
 
5
M. R. Guthaus, J. S. Ringenberg, D. Ernst, T. M. Austin, T. Mudge, R. B. Brown, "MiBench: A free, commercially representative embedded benchmark suite," Workshop on Workload Characterization, 2001.
 
6
 
7
M. Hashimoto and H. Onodera, "Post-Layout transistor sizing for power reduction in cell-based design," IEICE Transactions on Fundamentals, volume E84-A, number 11, 2001.
 
8
T. Hiramoto and M. Takamiya, "Low power and low voltage MOSFETs with variable threshold voltage controlled by back-bias," IEICE Transactions on Electronics, volume E83-C, number 2, 2000.
9
 
10
Intel Corp., "Intel XScale technology," http: //developer.intel.com/design/intelxscale/, 2002.
11
 
12
 
13
 
14
 
15
A. Klaiber, "The technology behind Crusoe processors," Transmeta Corporation, White Paper, 2000.
 
16
T. Kuroda, T. Fujita, S. Mita, T. Nagamatsu, S. Yoshioka, F. Sano, M. Norishima, M. Murota, M. Kato, M. Kinugasa, M. Kakumu, and T. Sakurai, "A 0.9V, 150MHz, 10mW, 4mm2, 2-D discrete cosine transform core processor with variable-threshold-voltage scheme," International Solid State Circuit Conference, 1996.
17
18
19
20
 
21
22
23


Collaborative Colleagues:
Akihito Sakanaka: colleagues
Seiichirou Fujii: colleagues
Toshinori Sato: colleagues