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Quantization-based watermarking performance improvement using host statistics: AWGN attack case
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Source International Multimedia Conference archive
Proceedings of the 2004 workshop on Multimedia and security table of contents
Magdeburg, Germany
SESSION: Attack and evaluation table of contents
Pages: 35 - 39  
Year of Publication: 2004
ISBN:1-58113-854-7
Authors
Oleksiy Koval  University of Geneva, Geneva, Switzerland
Sviatoslav Voloshynovskiy  University of Geneva, Geneva, Switzerland
Fernando Pérez-González  University of Vigo, Vigo, Spain
Frederic Deguillaime  University of Geneva, Geneva, Switzerland
Thierry Pun  University of Geneva, Geneva, Switzerland
Sponsors
SIGMULTIMEDIA: ACM Special Interest Group on Multimedia
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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ABSTRACT

In this paper we consider the problem of performance improvement of known-host-state (quantization-based) watermarking methods undergo Additive White Gaussian noise (AWGN) attack. The motivation of our research is twofold. The first reason concerns the common belief that any knowledge about the host image taken into account designing quantization-based watermarking algorithms can not improve their performance. The second reason refers to the poor practical performance of this class of methods at low Watermark-to-Noise Ratio (WNR) regime in comparison to the known-host-statistics techniques when AWGN attack is applied. We demonstrate in this paper that bit error probability of Dither Modulation (DM) and Distortion-Compensated Dither Modulation (DC-DM) against AWGN attack can be significantly reduced when the quantizers are designed using the statistics of the host data. For the case when the statistics of the data correspond to i.i.d. Laplacian distribution and using Uniform Deadzone Quantizer (UDQ) we develop close-form analytical models for the analysis of bit error probability of DM and DC-DM. Results of performed experiments demonstrate that significant performance improvement of classical DM and DC-DM with respect to bit error probability can be achieved with the minor increase of design complexity.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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Collaborative Colleagues:
Oleksiy Koval: colleagues
Sviatoslav Voloshynovskiy: colleagues
Fernando Pérez-González: colleagues
Frederic Deguillaime: colleagues
Thierry Pun: colleagues