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ABSTRACT
The next few process generations (65 nm and below) will have serious lithography and manufacturing constraints since the feature size is shrinking much more rapidly than the wavelengths used in manufacturing the chips. This paper starts with a quick tutorial on the Design for Manufacturability problems of these process generations, concentrating primarily on the limitations of optical lithography. The remainder of the talk covers the changes to physical design tools, such as placement and routing, that are needed to cope with these problems.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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[doi> 10.1145/378239.378343]
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CITED BY 10
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Lun-Chun Wei , Hung-Ming Chen , Li-Da Huang , Sarah Songjie Xu, Efficient and optimal post-layout double-cut via insertion by network relaxation and min-cost maximum flow, Proceedings of the 18th ACM Great Lakes symposium on VLSI, May 04-06, 2008, Orlando, Florida, USA
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