ACM Home Page
Please provide us with feedback. Feedback
Efficient reachability checking using sequential SAT
Full text Publisher SitePublisher Site PdfPdf (202 KB)
Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2004 Asia and South Pacific Design Automation Conference table of contents
Yokohama, Japan
SESSION: Formal verification table of contents
Pages: 418 - 423  
Year of Publication: 2004
ISBN:0-7803-8175-0
Authors
G. Parthasarathy  University of California, Santa Barbara, CA
M. K. Iyer  University of California, Santa Barbara, CA
K.-T. Cheng  University of California, Santa Barbara, CA
Li. C. Wang  University of California, Santa Barbara, CA
Sponsors
IEICE : Institute of Electronics, Information and Communication Engineers
: IEEE Circuits and Systems Society
IPSJ : Information Processing Society of Japan
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
Bibliometrics
Downloads (6 Weeks): 2,   Downloads (12 Months): 12,   Citation Count: 2
Additional Information:

abstract   references   cited by   collaborative colleagues  

Tools and Actions: Review this Article  

ABSTRACT

Reachability checking and Pre-image computation are fundamental problems in ATPG and formal verification. Traditional sequential search techniques based on ATPG/SAT, or on OBDDS have diverging strengths and weaknesses. In this paper, we describe how structural analysis and conflict-based learning are combined in order to improve the efficiency of sequential search. We use conflict-based learning and illegal state learning across time-frames. We also address issues in efficiently bounding the search space in a single time-frame and across time-frames. We analyze each of these techniques experimentally and demonstrate the advantages of each technique. We compare performance against a commercial sequential ATPG engine and VIS [13] on a set of standard benchmarks.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
2
 
3
 
4
FUJIWARA, H. FAN: a Fanout-oriented Test Pattern Generation Algorithm. In Proc. of ISCAS (June 1985), pp. 671--674.
 
5
 
6
 
7
8
9
 
10
MARCHOK, T., EL-MALEH, A., MALY, W., AND RAJSKI, J. A Complexity Analysis of Sequential ATPG. IEEE Transactions on Computer-Aided Design of Integrated Circuits & Systems. 15 n 11 (Nov. 1996), 1409--1423.
 
11
 
12
 
13
 
14
RUDELL, R., AND SANGIOVANNI-VINCENTELLI, A. Exact Minimization of Multiple-valued Functions for PLA optimization. In Proc. of the IEEE/ACM ICCAD (Nov. 1986), pp. 354--360.
 
15
 
16
17

Collaborative Colleagues:
G. Parthasarathy: colleagues
M. K. Iyer: colleagues
K.-T. Cheng: colleagues
Li. C. Wang: colleagues