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Opportunities with the open architecture test system
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Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2004 Asia and South Pacific Design Automation Conference table of contents
Yokohama, Japan
SESSION: (Special session) panel discussion: opportunities with the open architecture test system table of contents
Pages: 334 - 334  
Year of Publication: 2004
ISBN:0-7803-8175-0
Authors
Kazumi Hatayama  Renesas Technology, Japan
Rochit Rajsuman  Advantest America R&D Center
Sponsors
IEICE : Institute of Electronics, Information and Communication Engineers
: IEEE Circuits and Systems Society
IPSJ : Information Processing Society of Japan
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Press  Piscataway, NJ, USA
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Collaborative Colleagues:
Kazumi Hatayama: colleagues
Rochit Rajsuman: colleagues

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