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Active learning for automatic classification of software behavior
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Source International Symposium on Software Testing and Analysis archive
Proceedings of the 2004 ACM SIGSOFT international symposium on Software testing and analysis table of contents
Boston, Massachusetts, USA
SESSION: Program analysis II table of contents
Pages: 195 - 205  
Year of Publication: 2004
ISBN:1-58113-820-2
Also published in ...
Authors
James F. Bowring  Georgia Institute of Technology, Atlanta, Georgia
James M. Rehg  Georgia Institute of Technology, Atlanta, Georgia
Mary Jean Harrold  Georgia Institute of Technology, Atlanta, Georgia
Sponsors
SIGSOFT: ACM Special Interest Group on Software Engineering
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 12,   Downloads (12 Months): 129,   Citation Count: 22
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ABSTRACT

A program's behavior is ultimately the collection of all its executions. This collection is diverse, unpredictable, and generally unbounded. Thus it is especially suited to statistical analysis and machine learning techniques. The primary focus of this paper is on the automatic classification of program behavior using execution data. Prior work on classifiers for software engineering adopts a classical batch-learning approach. In contrast, we explore an active-learning paradigm for behavior classification. In active learning, the classifier is trained incrementally on a series of labeled data elements. Secondly, we explore the thesis that certain features of program behavior are stochastic processes that exhibit the Markov property, and that the resultant Markov models of individual program executions can be automatically clustered into effective predictors of program behavior. We present a technique that models program executions as Markov models, and a clustering method for Markov models that aggregates multiple program executions into effective behavior classifiers. We evaluate an application of active learning to the efficient refinement of our classifiers by conducting three empirical studies that explore a scenario illustrating automated test plan augmentation.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

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CITED BY  22

Collaborative Colleagues:
James F. Bowring: colleagues
James M. Rehg: colleagues
Mary Jean Harrold: colleagues