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Covering arrays for efficient fault characterization in complex configuration spaces
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Source International Symposium on Software Testing and Analysis archive
Proceedings of the 2004 ACM SIGSOFT international symposium on Software testing and analysis table of contents
Boston, Massachusetts, USA
SESSION: Testing I table of contents
Pages: 45 - 54  
Year of Publication: 2004
ISBN:1-58113-820-2
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Authors
Cemal Yilmaz  University of Maryland, College Park, Maryland
Myra B. Cohen  University of Auckland, Auckland, New Zealand
Adam Porter  University of Maryland, College Park, Maryland
Sponsors
SIGSOFT: ACM Special Interest Group on Software Engineering
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 2,   Downloads (12 Months): 31,   Citation Count: 12
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ABSTRACT

Testing systems with large configurations spaces that change often is a challenging problem. The cost and complexity of QA explodes because often there isn't just one system, but a multitude of related systems. Bugs may appear in certain configurations, but not in others.The Skoll system and process has been developed to test these types of systems through distributed, continuous quality assurance, leveraging user resources around-the-world, around-the-clock. It has been shown to be effective in automatically characterizing configurations in which failures manifest. The derived information helps developers quickly narrow down the cause of failures which then improves turn around time for fixes. However, this method does not scale well. It requires one to exhaustively test each configuration in the configuration space.In this paper we examine an alternative approach. The idea is to systematically sample the configuration space, test only the selected configurations, and conduct fault characterization on the resulting data. The sampling approach we use is based on calculating a mathematical object called a covering array. We empirically assess the effect of using covering array derived test schedules on the resulting fault characterizations and provide guidelines to practitioners for their use.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
L. Breiman, J. Freidman, R. Olshen, and C. Stone. Classification and Regression Trees. Wadsworth, Monterey, CA, 1984.
 
2
R. Brownlie, J. Prowse, and M. S. Padke. Robust testing of AT&T PMX/StarMAIL using OATS. AT&T Technical Journal, 71(3):41--7, 1992.
 
3
K. Burr and W. Young. Combinatorial test techniques: Table-based automation, test generation and code coverage. In Proc. of the Intl. Conf. on Software Testing Analysis & Review, 1998.
 
4
M. Chateauneuf and D. Kreher. On the state of strength-three covering arrays. Journal of Combinatorial Designs, 10(4):217--238, 2002.
 
5
 
6
7
8
 
9
10
 
11
 
12
N. Sloane. Covering arrays and intersecting codes. Journal of Combinatorial Designs, 1(1):51--63, 1993.
 
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CITED BY  12

Collaborative Colleagues:
Cemal Yilmaz: colleagues
Myra B. Cohen: colleagues
Adam Porter: colleagues