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Storage device performance prediction with CART models
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Source Joint International Conference on Measurement and Modeling of Computer Systems archive
Proceedings of the joint international conference on Measurement and modeling of computer systems table of contents
New York, NY, USA
POSTER SESSION: Posters table of contents
Pages: 412 - 413  
Year of Publication: 2004
ISBN:1-58113-873-3
Also published in ...
Authors
Mengzhi Wang  Carnegie Mellon University
Kinman Au  Carnegie Mellon University
Anastassia Ailamaki  Carnegie Mellon University
Anthony Brockwell  Carnegie Mellon University
Christos Faloutsos  Carnegie Mellon University
Gregory R. Ganger  Carnegie Mellon University
Sponsors
SIGMETRICS: ACM Special Interest Group on Measurement and Evaluation
ACM: Association for Computing Machinery
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): 5,   Downloads (12 Months): 29,   Citation Count: 4
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ABSTRACT

This work explores the application of a machine learning tool, CART modeling, to storage devices. We have developed approaches to predict a device's performance as a function of input workloads, requiring no knowledge of the device internals. Two uses of CART models are considered: one that predicts per-request response times (and then derives aggregate values) and one that predicts aggregate values directly from workload characteristics. After training on the device in question, both provide reasonably-accurate black box models across a range of test traces from real environments. An expanded version of this paper is available as a technical report [1].


REFERENCES

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1
Mengzhi Wang, Kinman Au, Anastassia Ailamaki, Anthony Brockwell, Christos Faloutsos, and Gregory R. Ganger. Storage device performance prediction with CART models. Technical Report CMU-PDL-04-103, 2004.


Collaborative Colleagues:
Mengzhi Wang: colleagues
Kinman Au: colleagues
Anastassia Ailamaki: colleagues
Anthony Brockwell: colleagues
Christos Faloutsos: colleagues
Gregory R. Ganger: colleagues