| Systematic functional coverage metric synthesis from hierarchical temporal event relation graph |
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Annual ACM IEEE Design Automation Conference
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Proceedings of the 41st annual Design Automation Conference
table of contents
San Diego, CA, USA
SESSION: Tools and strategies for dynamic verification
table of contents
Pages: 45 - 48
Year of Publication: 2004
ISBN:1-58113-828-8
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Downloads (6 Weeks): 2, Downloads (12 Months): 16, Citation Count: 4
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ABSTRACT
Functional coverage is a technique for checking the completeness of test vectors in HDL simulation. Temporal events are used to monitor the sequence of events in the specification. In this paper, automatic generation of temporal events for functional coverage is proposed. The HiTER is the graph where nodes represent basic temporal properties or subgraph and edges represent time-shift value between two nodes. Hierarchical temporal events are generated by traversing HiTER such that invalid, or irrelevant properties are eliminated. Concurrent edge groups make it possible to generate more comprehensive temporal properties and hierarchical structure makes it easy to describe large design by combining multiple subgraphs. Automatically enerated temporal events describe almost all the possible temporal properties of the design under verification.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Raanan Grinwald , Eran Harel , Michael Orgad , Shmuel Ur , Avi Ziv, User defined coverage—a tool supported methodology for design verification, Proceedings of the 35th annual conference on Design automation, p.158-163, June 15-19, 1998, San Francisco, California, United States
[doi> 10.1145/277044.277081]
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Aarti Gupta , Albert E. Casavant , Pranav Ashar , Akira Mukaiyama , Kazutoshi Wakabayashi , X. G. (Sean) Liu, Property-Specific Testbench Generation for Guided Simulation, Proceedings of the 2002 conference on Asia South Pacific design automation/VLSI Design, p.524, January 07-11, 2002
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Pei Hsin Ho , Thomas Shiple , Kevin Harer , James Kukula , Robert Damiano , Valeria Bertacco , Jerry Taylor , Jiang Long, Smart simulation using collaborative formal and simulation engines, Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design, November 05-09, 2000, San Jose, California
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J. Ruf , D. Hoffmann , T. Kropf , W. Rosenstiel, Simulation-guided property checking based on a multi-valued AR-automata, Proceedings of the conference on Design, automation and test in Europe, p.742-748, March 2001, Munich, Germany
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Synopsys. OpenVera Language Reference Manual, 2.2 edition, Apr. 2002.
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S. Ur and A. Ziv. Off-the-shelf vs. custom made coverage models, which is the one for you? In International Symposium on Software Testing and Analysis Review, 1998.
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CITED BY 4
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Vasco Jerinić , Jan Langer , Ulrich Heinkel , Dietmar Müller, New methods and coverage metrics for functional verification, Proceedings of the conference on Design, automation and test in Europe: Proceedings, March 06-10, 2006, Munich, Germany
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