| A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits |
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International Conference on Computer Aided Design
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Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
table of contents
Page: 689
Year of Publication: 2003
ISBN ~ ISSN:1092-3152 , 1-58113-762-1
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IEEE Computer Society
Washington, DC, USA
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Downloads (6 Weeks): 5, Downloads (12 Months): 25, Citation Count: 11
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ABSTRACT
Input vector control has been used to minimize the leakage powerconsumption of a circuit in sleep state. In this paper, we presenta novel heuristic for determining a low leakage vector to beapplied to a circuit in sleep state. The heuristic is a greedy searchbased on the controllability of nodes in the circuit and uses thefunctional dependencies among cells in the circuit to guide thesearch. Results on a set of ISCAS and MCNC benchmark circuitsshow that in all cases our heuristic returns a vector having aleakage within 5% of that of the vector obtained using an extensiverandom search, with orders of magnitude improvement incomputational speed.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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CITED BY 11
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Lei Cheng , Liang Deng , Deming Chen , Martin D. F. Wong, A fast simultaneous input vector generation and gate replacement algorithm for leakage power reduction, Proceedings of the 43rd annual conference on Design automation, July 24-28, 2006, San Francisco, CA, USA
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Yu Wang , Hong Luo , Ku He , Rong Luo , Huazhong Yang , Yuan Xie, Temperature-aware NBTI modeling and the impact of input vector control on performance degradation, Proceedings of the conference on Design, automation and test in Europe, April 16-20, 2007, Nice, France
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Kanupriya Gulati , Nikhil Jayakumar , Sunil P. Khatri , D. M. H. Walker, A probabilistic method to determine the minimum leakage vector for combinational designs in the presence of random PVT variations, Integration, the VLSI Journal, v.41 n.3, p.399-412, May, 2008
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