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A Heuristic to Determine Low Leakage Sleep State Vectors for CMOS Combinational Circuits
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Source International Conference on Computer Aided Design archive
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design table of contents
Page: 689  
Year of Publication: 2003
ISBN ~ ISSN:1092-3152 , 1-58113-762-1
Authors
Rahul M. Rao  University of Michigan, Ann Arbor
Frank Liu  IBM, Austin, TX
Jeffrey L. Burns  IBM, Austin, TX
Richard B. Brown  University of Michigan, Ann Arbor
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Computer Society  Washington, DC, USA
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 25,   Citation Count: 11
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DOI Bookmark: 10.1109/ICCAD.2003.9

ABSTRACT

Input vector control has been used to minimize the leakage powerconsumption of a circuit in sleep state. In this paper, we presenta novel heuristic for determining a low leakage vector to beapplied to a circuit in sleep state. The heuristic is a greedy searchbased on the controllability of nodes in the circuit and uses thefunctional dependencies among cells in the circuit to guide thesearch. Results on a set of ISCAS and MCNC benchmark circuitsshow that in all cases our heuristic returns a vector having aleakage within 5% of that of the vector obtained using an extensiverandom search, with orders of magnitude improvement incomputational speed.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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[1] J. Halter and F. Najm, "A Gate-Level Leakage Power Reduction Method for Ultra Low Power CMOS Circuits," Proc. of CICC, pp. 475-478, 1997.
 
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[5] T. Kurado, et.al, "A 0.9V, 150MHz, 10-mW, 4mm2, 2-D Discrete Cosine Transform Core Processor with Variable Threshold (Vt) Scheme," IEEE Journal of Solid State Circuits, vol. 31, no. 11, pp. 1770-1779, Nov. 1996.
 
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[6] F. Assaderaghi, "DTMOS: Its Derivatives and Variations, and their Potential Applications," Proc. of 12th Intnl. Conference on Microelectronics, pp. 9-19, 2000.
 
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[9] M. Johnson, D. Somasekhar and K. Roy, "Models and Algorithms for Bounds on Leakage in CMOS Circuits," IEEE Trans. on CAD, vol. 18, no. 6, pp. 714-725, Jun. 1999.
 
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[11] M. Abramovici, M. Breuer, A. Friedman, "Digital Systems Testing and Testable Design," IEEE Press, 1995.

CITED BY  11
 
 
 
 
 
 

Collaborative Colleagues:
Rahul M. Rao: colleagues
Frank Liu: colleagues
Jeffrey L. Burns: colleagues
Richard B. Brown: colleagues