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ABSTRACT
Practical mixed-signal DFT solutions are presentedwith an emphasis on performance, cost, and testcoverage.Special consideration is given to thepossible DFT techniques for Phase-Locked Loops(PLLs) with associated implications on testcoverage, performance, cost, and time to market.An introduction to practical DFT techniques fordata converters (A/D and D/A) follow.Anoverview of IEEE P1149.4 analog test bus standardconcludes the embedded tutorial.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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