Prediction of interconnect adjacency distribution: derivation, validation, and applications

ABSTRACT

An analytical interconnect adjacency distribution model for random logic interconnect networks based on the Bernoulli probability distribution is derived. By definition, interconnect adjacency is the fractional length of an interconnect for which there is a neighboring interconnect at minimum spacing. Some possible applications of the interconnect adjacency distribution are statistical cross-talk analysis, interconnect yield prediction, and statistical interconnect reference circuit for more realistic capacitance estimation.The model uses only simple and readily available system parameters well known to designers. These are the wire-length distribution and the average channel utilization. Comparison to product data shows good agreement with the model.

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.2 Design Aids
          Subjects: Simulation

Additional Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.2 Design Aids
          Subjects: Layout

  C. Computer Systems Organization
  C.4 PERFORMANCE OF SYSTEMS
      Subjects: Modeling techniques

General Terms:
Design, Experimentation, Performance, Theory

Keywords:
interconnect adjacency, interconnect pattern density, prediction, probability density function, stochastic model