ACM Home Page
Please provide us with feedback. Feedback
Defect tolerance for nanocomputer architecture
Full text PdfPdf (501 KB)
Source International Workshop on System-Level Interconnect Prediction archive
Proceedings of the 2004 international workshop on System level interconnect prediction table of contents
Paris, France
SESSION: Unconventional interconnects table of contents
Pages: 89 - 96  
Year of Publication: 2004
ISBN:1-58113-818-0
Authors
Arvind Kumar  Cornell University
Sandip Tiwari  Cornell University
Sponsors
ACM: Association for Computing Machinery
SIGDA: ACM Special Interest Group on Design Automation
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 5,   Downloads (12 Months): 16,   Citation Count: 0
Additional Information:

abstract   references   index terms   collaborative colleagues   peer to peer  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/966747.966765
What is a DOI?

ABSTRACT

Defect tolerant architectures will be mandatory for building economical and cheap computing systems with billions of devices of nanometer dimension because it will contain significant number of defects due to statistical variations. The basic idea behind a defect tolerant custom configurable system is to build the system out of partially perfect components, detect the defects and configure the available good resources using software. In this paper we discuss implications of defect tolerance on power, area, delay and other relevant parameters for computing architectures. The additional requirement of a scalable configuration mechanism, redundant components and detection scheme necessitates extra burden on the interconnect to sustain it. Through back-of-envelope calculations using a priori wire length estimation and intuitive arguments we will illustrate the hidden cost of supporting such an architecture.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
IEEE Symposium on Defect and Fault Tolerance in VLSI Systems, 1995--2003.
 
2
International Workshop on System Level Interconnect Prediction (SLIP), 1999--2003.
 
3
 
4
H. B. Bakoglu. Circuits, Interconnections, and Packaging for VLSI. Addison-Wesley Publishing Company, Reading, Massachusetts, 1990.
 
5
 
6
B. Culberston, R. Amerson, R. Carter, P. Kuekes, and G. Snider. Exploring architectures for volume visualization on the teramac custom computer. In Proc. IEEE Symposium on FPGA's for Custom Computing Machines, pages 80--88, 1996.
 
7
J. Davis, V. De, and J. Meindl. A stochastic wire-length distribution for gigascale intergration - part 1: Derivation and validation. IEEE Transactions on Electron Devices, 45 (3): 580--589, 1998.
 
8
J. Davis, V. De, and J. Meindl. A stochastic wire-length distribution for gigascale intergration - part 2: Applications to clock frequency, power dissipation, and chip size estimation. IEEE Transactions on Electron Devices, 45(3):590--597, 1998.
 
9
W. E. Donath. On the equivalence of memory to random logic. IBM Journal of Research and Development, 18: 401--407, 1974.
 
10
W. E. Donath. Placement and average interconnection lengths of computer logic. IEEE Transactions on Circuit and Systems, CAS-26:272--277, 1979.
 
11
M. Feuer. Connectivity of random logic. IEEE Transactions on Computers, C-31:29--33, 1982.
 
12
A. Gamal. Two-dimensional stochastic model for interconnections in master slice integrated circuits. IEEE Transactions on Circuits and Systems, CAS-28 (2):127--138, 1981.
 
13
J. R. Heath, P. J. Kuekes, G. S. Snider, and S. Williams. A defect-tolerant computer architecture: Opportunities for nanotechnology. Science, 280:1716--1721, 1998.
 
14
W. Heller, C. Hsi, and W. Mikhail. Wirability-designing wiring space for chips and chip packages. IEEE Design and Test Magazine, pages 43--51, 1984.
 
15
 
16
B. Landman and R. Russo. On a pin versus block relationship for partitions of logic graphs. IEEE Transactions on Computers, C-20: 1469--1479, 1971.
 
17
18
 
19
S. Nikoletseas, G. Pantziou, P. Psycharis, and P. Spirakis. On the reliability of fat-trees. In 14th European Symposium on Parallel Processing, 1997.
20
 
21
D. Stroobandt. A Priori Wire Length Estimates for Digital Design. Kluwer Publications, 2001.
 
22
D. Stroobandt and J. V. Campenhout. Accurate interconnection length estimations for predictions early in the design cycle. VLSI Design, 10 (1):1--20, 1999.
 
23
X. Yang, R. Kastnr, and M. Sarrafzadeh. Congestion during top-down placement. IEEE Transactions on CAD of ICs and Systems, 21(1):72--80, 2002.

Collaborative Colleagues:
Arvind Kumar: colleagues
Sandip Tiwari: colleagues

Peer to Peer - Readers of this Article have also read: