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ABSTRACT
Switching activity estimation is a crucial step in estimating dynamic power consumption in CMOS circuits. In [1] , we proposed a new switching probability model based on Bayesian Networks which captures accurately the various correlations in the circuit. In this work, we propose a new strategy for efficient segmentation of large circuits so that they can be mapped to Multiple Bayesian Networks (MBN). The goal here is to achieve higher accuracy while reducing the memory requirements during the computation. In order to capture the correlations among the boundaries of segments, a tree-dependent (TD) distribution is proposed between the segment boundaries such that the TD distribution is closest to the actual distribution of switching variable with some distance criterion. We use a Maximum Weight Spanning Tree (MWST) based approximation [4] using mutual information between two variables at the boundary as weight of the edge between the variables. Experimental results for ISCAS'85 circuits show that the proposed method improves accuracy significantly over other methods.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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[5] S. Kullbuck, R. A. Leibler, "Information and Sufficiency", Ann. Math. Statistics, vol. 22, pp. 79-86.
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A. Ghosh , S. Devadas , K. Keutzer , J. White, Estimation of average switching activity in combinational and sequential circuits, Proceedings of the 29th ACM/IEEE conference on Design automation, p.253-259, June 08-12, 1992, Anaheim, California, United States
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[7] R. Marculescu, D. Marculescu, and M. Pedram, "Probabilistic Modeling of Dependencies During Switching Activity Analysis", revised version submitted to IEEE Trans. CAD, URL= http://atrak.usc.edu/~massoud/ sign_download.cgi?pecp-journal.ps
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[8] R. Marculescu, D. Marculescu, and M. Pedram, "Probabilistic Modeling of Dependencies During Switching Activity Analysis", IEEE Trans. CAD, vol 17-2, pp. 73-83, February 1998.
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[10] F. N. Najm, "Transition Density: A New Measure of Activity in Digital Circuits", IEEE Transaction on CAD, vol. 12-2, pp. 310- 323, February 1993.
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[11] S. Ercolani, M. Favalli, M. Damiani, P. Olivo, and B. Ricco, "Testability Measures in Pseudorandom Testing", IEEE Transactions on CAD, vol. 11, pp. 794-800, June 1992.
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[12] C.-S. Ding, C.-Y. Tsui, and M. Pedram, "Gate-Level Power Estimation Using Tagged Probabilistic Simulation", IEEE Trans. CAD, vol. 17-11, pp. 1099-1107, November, 1998.
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Chi-Ying Tsui , Massoud Pedram , Alvin M. Despain, Efficient estimation of dynamic power consumption under a real delay model, Proceedings of the 1993 IEEE/ACM international conference on Computer-aided design, p.224-228, November 07-11, 1993, Santa Clara, California, United States
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[17] F. N. Najm, R. Burch, P. Yang, and I. N. Hajj, " Probabilistic Simulation for Reliability Analysis of CMOS Circuits", IEEE Trans. on CAD, vol 9-4, pp. 439-450, April 1990.
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[18] P. Schneider, and U. Schlichtmann, "Decomposition of Boolean Functions for Low Power Based on a New Power Estimation Technique", Proc. 1994 Int'l Workshop on Low Power Design, pp. 123-128, April 1994.
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Radu Marculescu , Diana Marculescu , Massoud Pedram, Switching activity analysis considering spatiotemporal correlations, Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design, p.294-299, November 06-10, 1994, San Jose, California, United States
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