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Evaluating Run-Time Techniques for Leakage Power Reduction
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Source Asia and South Pacific Design Automation Conference archive
Proceedings of the 2002 Asia and South Pacific Design Automation Conference table of contents
Page: 31  
Year of Publication: 2002
ISBN:0-7695-1441-3
Authors
David Duarte  Department of CSE, The Pennsylvania State University, University Park, PA
Yuh-Fang Tsai  Department of CSE, The Pennsylvania State University, University Park, PA
Narayanan Vijaykrishnan  Department of CSE, The Pennsylvania State University, University Park, PA
Mary Jane Irwin  Department of CSE, The Pennsylvania State University, University Park, PA
Sponsor
SIGDA: ACM Special Interest Group on Design Automation
Publisher
IEEE Computer Society  Washington, DC, USA
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Downloads (6 Weeks): 2,   Downloads (12 Months): 32,   Citation Count: 29
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ABSTRACT

While some leakage power reduction techniques require modification of process technology achieving savings at the fabrication stage, others are based on circuit-level optimizations and are applied at run-time. We focus our study on the latter kind and compare three techniques: Input Vector Control, Body Bias Control and Power Supply Gating. We determine their limits and benefits, in terms of the potential leakage reduction, performance penalty and area and power overhead. The importance of the 'minimum idle time' parameter, as an additional evaluation tool, is emphasized, as well as the feasibility of achieving Power Supply Gating at low levels of granularity. The obtained data supports the formulation of a comprehensive leakage reduction scheme, in which each technique is targeted for certain types of functional units and a given level of granularity depending on the incurred overhead cost and the obtainable savings.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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CITED BY  29
 
 
 
 
 
 
 
 
 
 
 
 
 
Collaborative Colleagues:
David Duarte: colleagues
Yuh-Fang Tsai: colleagues
Narayanan Vijaykrishnan: colleagues
Mary Jane Irwin: colleagues

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