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Evaluation of a concurrent error detection method for microprogrammed control units
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Source International Symposium on Microarchitecture archive
Proceedings of the 21st annual workshop on Microprogramming and microarchitecture table of contents
San Diego, California, United States
Pages: 1 - 10  
Year of Publication: 1988
ISBN:0-8186-1919-8
Authors
A. Bailas  Department of Electrical Engineering, University of Minnesota, Minneapolis, MN
L. L. Kinney  Department of Electrical Engineering, University of Minnesota, Minneapolis, MN
Sponsor
SIGMICRO: ACM Special Interest Group on Microarchitectural Research and Processing
Publisher
IEEE Computer Society Press  Los Alamitos, CA, USA
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REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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A. Guha and L. L. Kinney, "Monitors of Varying Complexity for Concurrently Testing Microprogrammed Control Units", Proc. IEEE International Conference on Computer-Aided Design, pp. 137-139, Santa Clara, Nov. 1984.
 
GUHA 85
A. Guha, "Concurrent Testing Of Microprogrammed Control Units And Combinational Logic", Ph.D Thesis, Dep. Elec. Eng. University of Minnesota, Minneapolis, MN, Dec 1985.
 
GUHA 87
A. Guha and L. L. Kinney, "Reduced Monitor Designs for Concurrent Testing of Microprogrammed Control Units", Internal Report, University of Minnesota, Minneapolis, MN, I987
 
HSIAO 77
M. Y. Hsiao, A. M. Patel and D. K. Pradhan, " Store Address Generator with On-Line Fault- Detection Capability", IEEE Transactions on Computers, vol. C- 26, NO 11, Nov. 1977.
 
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L. L. Kinney and T. Ramakrishnan, "Fault Collapsing For Concurrent Error Detection Analysis", 26th Allerton Conference on Communications, Control and Computing, Sep 1988.
 
KRAFT 81
 
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PRADHAN -
D. K. Pradhan ,M. Y. Hsiao, A. M. Patel and S. Y. Su, "Shift Registers Designed for On-Line Fault Detection".
 
SELLERS 68
F. F. Sellers, Jr., M. Y. Hsiao and L. W. Bearnson, "Error Detecting logic for Digital Computers", McGraw-Hill, New York, 1968.
 
STAELIN 85
C. H. Staelin and A. Albicki, "Evaluation of Monitor Complexity for Concurrently Testing Microprogrammed Control Units", Proc. International Test Conference, pp. 733-736, Nov. 1985.
 
WAKERLY 78
J. Wakerly, "Error Detecting Codes, Self-Checking Circuits and Applications", North Holland, New York, 1978.
 
YEN 87
M. M. Yen, W. K. Fuchs and J. A. Abraham, "Designing for Concurrent Error Detection in VLSI: Application to a Microprogram Control Unit", IEEE Journal of Solid State Circuits, vol. SC-22, NO 4, Aug 1987.
 
ZYCAD
Zilos Reference Manual. 1984.


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