| Rescaling reliability bounds for a new operational profile |
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International Symposium on Software Testing and Analysis
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Proceedings of the 2002 ACM SIGSOFT international symposium on Software testing and analysis
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Roma, Italy
SESSION: Theory of testing and reability
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Pages: 180 - 190
Year of Publication: 2002
ISBN ~ ISSN:0163-5948 , 1-58113-562-9
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Author
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Peter G Bishop
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City University, Northampton Square, London, EC1V 0HB, UK
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Downloads (6 Weeks): 6, Downloads (12 Months): 24, Citation Count: 0
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ABSTRACT
One of the main problems with reliability testing and prediction is that the result is specific to a particular operational profile. This paper extends an earlier reliability theory for computing a worst case reliability bound. The extended theory derives a re-scaled reliability bound based on the change in execution rates of the code segments in the program. In some cases it is possible to derive a maximum failure rate bound that applies to any change in the profile. It also predicts that (in principle) a "fair" test profile can be derived where the reliability bounds are relatively insensitive to the operational profile. In addition the theory allows unit and module test coverage measures to be incorporated into an operational reliability bound prediction. The implications of the theory are discussed, and the theory is evaluated by applying it to two example programs with known faults.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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P. G. Bishop, R. E. Bloomfield, "A Conservative Theory for Long-Term Reliability Growth Prediction", IEEE, Trans. Reliability, vol. 45, no. 4, pp 550-560, Dec. 1996 {3}
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J. R. Gaffney, "Estimating the Number of Faults in Code", IEEE Trans. Software Engineering, vol. SE-10, no. 4, 1984
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M. Kaaniche, K. Kanoun, M. Cukier and M. Bastos Martini, "Software Reliability Analysis of Three Successive Generation of a Switching System", LAAS, Report no 94.030, 1994.
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A Pasquini, A N Crespo and P Matrella, "Sensitivity of reliability growth models to operational profile errors", IEEE Trans. Reliability, vol. 45, no. 4, pp 531-540, Dec. 1996
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