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ABSTRACT
To tackle the current day testing complexity of VLSI circuits Design For Testability (DFT) is becoming more of a necessity. However VLSI designers are yet to accept DFT mainly due to lack of effective tools. Expert Systems technology promises to be an useful means to present to the designer the gamut of DFT knowledge developed so far, primarily by test experts, in a more effective way. DFTEXPERT is an attempt towards this direction. This paper presents the major components of DFTEXPERT and also demonstrates its capability through a small illustration.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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