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Using expert systems components to enhance reliability analysis tools
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Source International conference on Industrial and engineering applications of artificial intelligence and expert systems archive
Proceedings of the 1st international conference on Industrial and engineering applications of artificial intelligence and expert systems - Volume 1 table of contents
Tullahoma, Tennessee, United States
Pages: 287 - 297  
Year of Publication: 1988
ISBN:0-89791-271-3
Authors
William B. Frakes  AT&T Bell Labs, Holmdel, NJ
D. H. Myers  AT&T Bells Labs, Holmdel, NJ
Sponsor
SIGART: ACM Special Interest Group on Artificial Intelligence
Publisher
ACM  New York, NY, USA
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ABSTRACT

In this paper we discuss the use of expert system components to enhance reliability analysis software tools. The discussion focuses on two expert systems built to enhance STAR and SUPER, reliability analysis tools developed at AT&T Bell Laboratories. STAR is used to select a model to fit life data. SUPER is used to model system reliability. The expert components were developed using AVIEN, an expert system development tool that allows easy integration of expert system components into C based software.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
Buswell, G.D., et.al., "STAR - Software for the Analysis and Presentation of Reliability Data", American Statistical Association 1985 Proceedings of the Statistical Computing Section, LasVegas, 1985.
 
2
Crocker, S.L., et. al., 1985. "SUPER: System Used for Prediction and Evaluation of Reliability, Paper read at iEEE Conference on Reliability of Computer Controlled Telecommunications Systems," Val David, Canada, 1985.
 
3
 
4
Anderson, J.R, et. al., "Intelligent Tutoring Systems," Science, 228,456-462.
 
5

Collaborative Colleagues:
William B. Frakes: colleagues
D. H. Myers: colleagues

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