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ABSTRACT
A new digital simulation algorithm is presented based on the concept of demand driven simulation. Where traditional event driven simulation propagates signal values forward through a circuit in response to input pin events, demand driven simulation propagates requests for simulation values backwards both through the circuit and through time. In this manner, only those evaluations required to obtain “watched” signal values are performed. BACKSIM, the simulator based on this algorithm, has proven to be faster and more efficient than event driven simulation for every test case tried to date.
REFERENCES
Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.
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Brglez, Franc, Phillip Pownall and Robert Hum, "Accelerated ATPG and Fault Grading Via Testability Analysis," Proceedings of the International Symposium on Circuits and Systems, 1985".
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Pfister, Gregory, "The IBM Yorktown Simulation Engine," Proceedings of the IEEE, pp. 850-860, June 1986.
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"ZyCad LE-1001 Product Description," ZYCAD, 1982.
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CITED BY 10
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Wing Yee Au , Daniel Weise , Scott Seligman, Automatic generation of compiled simulations through program specialization, Proceedings of the 28th conference on ACM/IEEE design automation, p.205-210, June 17-22, 1991, San Francisco, California, United States
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