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Source Joint International Conference on Measurement and Modeling of Computer Systems archive
Proceedings of the 2000 ACM SIGMETRICS international conference on Measurement and modeling of computer systems table of contents
Santa Clara, California, United States
Pages: 124 - 133  
Year of Publication: 2000
ISBN:1-58113-194-1
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Authors
Sponsor
SIGMETRICS: ACM Special Interest Group on Measurement and Evaluation
Publisher
ACM  New York, NY, USA
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Downloads (6 Weeks): n/a,   Downloads (12 Months): n/a,   Citation Count: 9
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CITED BY  9
 
 
 
 
 
 
 
 

Collaborative Colleagues:
Eitan Altman: colleagues
Konstantin Avrachenkov: colleagues
Chadi Barakat: colleagues