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Effects of delay models on peak power estimation of VLSI sequential circuits
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Source International Conference on Computer Aided Design archive
Proceedings of the 1997 IEEE/ACM international conference on Computer-aided design table of contents
San Jose, California, United States
Pages: 45 - 51  
Year of Publication: 1997
ISBN:0-8186-8200-0
Authors
Michael S. Hsiao  Department of Electrical and Computer Engineering, Rutgers University, Piscataway, NJ
Elizabeth M. Rudnick  Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL
Janak H. Patel  Center for Reliable and High-Performance Computing, University of Illinois, Urbana, IL
Sponsors
SIGDA: ACM Special Interest Group on Design Automation
IEEE-CS : Computer Society
Publisher
IEEE Computer Society  Washington, DC, USA
Bibliometrics
Downloads (6 Weeks): 4,   Downloads (12 Months): 7,   Citation Count: 11
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ABSTRACT

Previous work has shown that maximum switching density at a given node is extremely sensitive to a slight change in the delay at that node. However, when estimating the peak power for the entire circuit, the powers estimated must not be as sensitive to a slight variation or inaccuracy in the assumed gate delays because computing the exact gate delays for every gate in the circuit during simulation is expensive. Thus, we would like to use the simplest delay model possible to reduce the execution time for estimating power, while making sure that it provides an accurate estimate, i.e., that the peak powers estimated will not vary due to a variation in the gate delays. Results for four delay models are reported for the ISCAS85 combinational benchmark circuits, ISCAS89 sequential benchmark circuits, and several synthesized circuits.


REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
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C. Wang, K. Roy, and T. Chou, "Maximum power estimation for sequential circuits using a test generation based technique," Proc. Custom Integrated Circuits Conf., 1996.
 
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CITED BY  11
 
 
 
 
 
 
 
 

Collaborative Colleagues:
Michael S. Hsiao: colleagues
Elizabeth M. Rudnick: colleagues
Janak H. Patel: colleagues

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