ACM Home Page
Please provide us with feedback. Feedback
The ups and downs of programmer stress
Full text PdfPdf (187 KB)
Source
Communications of the ACM archive
Volume 40 ,  Issue 4  (April 1997) table of contents
Pages: 17 - 19  
Year of Publication: 1997
ISSN:0001-0782
Author
Publisher
ACM  New York, NY, USA
Bibliometrics
Downloads (6 Weeks): 6,   Downloads (12 Months): 44,   Citation Count: 4
Additional Information:

references   cited by   index terms   collaborative colleagues  

Tools and Actions: Request Permissions Request Permissions    Review this Article  
DOI Bookmark: Use this link to bookmark this Article: http://doi.acm.org/10.1145/248448.248452
What is a DOI?

REFERENCES

Note: OCR errors may be found in this Reference List extracted from the full text article. ACM has opted to expose the complete List rather than only correct and linked references.

 
1
 
2
Fujigaki, Y. Stress analysis: A new perspective on peopleware. Amer. Prog. 6, 7 0ul. 1993), 33-38.
 
3
Furuyama, T. Arai, Y., and Iio, K. Fault generation model and mental stress effect analysis. In Proc. oft he Second International Con~rence on Achieving Q~ality in So25ware, (Venice), Oct. 18-20, 1993.
 
4
Zawacki R. Motivating IT people in the 90s: An 'alarming drop' in job satisfaction. Sofw. Pract. 3, 6 (Nov. 1993), 1, 4-5.