Automatic netlist extraction for measurement-based characterization of off-chip interconnect

ABSTRACT

An approach is presented for modeling board level, package-level, and MCM substrate-level interconnect circuitry based an measured time domain refectometry data. The time-domain scattering parameters of a multiport system are used to extract a SPICE netlist which uses standard elements to match the behavior of the device up to a user-specified cutoff frequency. Linear or nonlinear circuits may be connected to the model ports, and the entire circuit simulated in a standard circuit simulator. Two-port and four-port example microstrip circuits are characterized, and the simulation results are compared with measured data. Delay, reflection transmission, and crosstalk are accurately modeled in each case.

REFERENCES

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INDEX TERMS

Primary Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS
      B.7.2 Design Aids
          Subjects: Simulation

Additional Classification:
  B. Hardware
  B.7 INTEGRATED CIRCUITS

  F. Theory of Computation
  F.2 ANALYSIS OF ALGORITHMS AND PROBLEM COMPLEXITY
      F.2.1 Numerical Algorithms and Problems
          Subjects: Computations on matrices

General Terms:
Algorithms, Design, Measurement

Keywords:
MCM substrate-level interconnect circuitry, SPICE netlist, automatic netlist extraction, circuit simulator, crosstalk, delay, linear circuits, measured time domain refectometry data, measurement-based characterization, microstrip circuits, multichip modules, multiport system, nonlinear circuits, off-chip interconnect, reflection transmission, time-domain scattering parameters, user-specified cutoff frequency